کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1677200 | 1518105 | 2006 | 6 صفحه PDF | دانلود رایگان |
We were interested in characterizing films of cubic γ″-FeN not only by X-ray diffraction, but also by scanning electron microscopy and transmission electron microscopy. Samples were fabricated by dc magnetron sputtering of an iron target in N2 atmosphere at high pressure. The X-ray diffraction technique indicated that films were composed of a single phase, i.e. the γ″-FeN phase. Scanning electron microscopy and transmission electron microscopy showed the presence of a strong 〈111〉 texture in the coatings. Film microstructure consisted of triangular cross-section rods perpendicular to the substrate. These rods contain {111} twin defects. We also frequently observed supplementary diffraction spots on electron diffraction patterns of some rods. The intensity of these spots is much less than those of the γ″-FeN phase. These weak spots also lie at half the distance between two consecutive spots of the γ″-FeN phase. These two facts suggest that these additional spots correspond to a superstructure of the γ″-FeN. This new phase is face-centered cubic and its lattice parameter is twice the one of γ″-FeN, i.e. a = 0.864 nm. Darkfield transmission electron microscopy experiments performed with both fundamental and superstructure spots indicate that the new phase is located on the surface of the rods and form nanodomains.
Journal: Thin Solid Films - Volume 494, Issues 1–2, 3 January 2006, Pages 184–189