کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5466576 | 1398906 | 2016 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Microstructure and local electrical investigation of lead-free α-La2WO6 ferroelectric thin films by piezoresponse force microscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
La2WO6 (LWO) thin films with the α high-temperature orthorhombic polymorph have been grown on (001)-LaAlO3 (LAO) substrates by pulsed laser deposition. The X-ray diffraction study evidences that the films are (00l)-oriented. This matching appears to be in good agreement with the compatibility between the α-LWO bulk/LAO substrate crystal lattices. Pole figure measurements lead to the following crystallographic relationships between the film and substrate: [100]α-LWOâ [110]LAO, [010]α-LWO â [11-0]LAO and [001]α-LWO â [001]LAO. Film cell parameters measured on a LaNiO3 buffer layer, setting as electrode for electric measurements, lead to a = 16.217(5) Ã
, b = 5.607(1) Ã
and c = 8.918(8) Ã
. A Williamson-Hall plot carried out on a LWO film reveals that the microstrain is 0.16% along the growth direction while the coherent domain dimension is 16Â nm. Piezoresponse force microscopy imaging and piezoloops recording demonstrate that these films are piezoelectric/ferroelectric on nanoscale.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 617, Part B, 30 October 2016, Pages 76-81
Journal: Thin Solid Films - Volume 617, Part B, 30 October 2016, Pages 76-81
نویسندگان
Thomas Carlier, Marie-Hélène Chambrier, Anthony Ferri, Alexandre Bayart, Pascal Roussel, Sébastien Saitzek, Rachel Desfeux,