کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8035150 | 1518048 | 2014 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Epitaxial α-Mn(001) films on MgO(001)
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
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چکیده انگلیسی
20Â nm manganese films were deposited on a MgO(001) substrate by the molecular beam epitaxy under ultrahigh vacuum conditions. The films were characterized in situ by low energy electron diffraction (LEED), electron spectroscopies and scanning tunneling microscopy (STM) and ex situ by X-ray diffraction (XRD). During the deposition the substrate was kept at room temperature. The as-deposited films did not show any distinct LEED pattern, which emerged only upon in situ annealing at 423Â K, and further improved upon subsequent annealing steps at temperatures up to 623Â K. The LEED pattern indicated a square surface unit cell that is commensurate with the MgO(001) substrate. STM images showed island growth of the films. The islands exposed atomically flat terraces extending approximately over 500Â Ã
. The XRD analysis confirmed a single phase α-Mn film structure with the (001) orientation, rotated in plane by 45° relative to the MgO(001) lattice.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 556, 1 April 2014, Pages 137-141
Journal: Thin Solid Films - Volume 556, 1 April 2014, Pages 137-141
نویسندگان
R.P. Socha, M. Szczepanik-Ciba, W. Powroźnik, N. Spiridis, J. Korecki,