کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8035935 1518059 2013 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Transmission electron microscopy characterization of CrN films on MgO(001)
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Transmission electron microscopy characterization of CrN films on MgO(001)
چکیده انگلیسی
Two CrN(001) films with different thickness were grown on MgO(001) substrates using unbalanced d.c. magnetron sputtering. The morphology and interfacial structure of the films are characterized by using conventional transmission electron microscopy, weak-beam dark-field microscopy and spherical aberration (CS)-corrected high-resolution transmission electron microscopy. The microscopy studies revealed the well-known cube-on-cube orientation relationship. While an interface dislocation network with b→=½aCrN<100> edge dislocations was identified, only part of the lattice mismatch is relaxed. The misfit dislocation structure and growth defects are analyzed and discussed based on the weak-beam dark-field and high-resolution transmission electron microscopy results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 545, 31 October 2013, Pages 154-160
نویسندگان
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