کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8036467 1518062 2013 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Effect of excess Bi on structure and ferroelectric properties of polycrystalline BiFeO3 thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Effect of excess Bi on structure and ferroelectric properties of polycrystalline BiFeO3 thin films
چکیده انگلیسی
Polycrystalline BiFeO3 thin films with overdosed Bi of up to 15 mol% were prepared through chemical solution deposition. All the films crystallized in R3c structure after annealing at 550 °C for 5 h by normal furnace. The analysis of out-of-plane and in-plane X-ray diffraction showed that the lattice constants and in-plane stress of films strongly depended on the amount of excess Bi, where lattice constants were minimums and in-plane stress was a maximum at excess Bi of 5 mol%. The films exhibited the largest saturation polarization of 14.8 μC cm− 2 at excess Bi of 5 mol%, revealing a correlation with the in-plane tensile stress. These results suggested that the excess Bi greatly influenced the polarization properties of BiFeO3 thin films through the lattice distortion induced by the in-plane stress.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 542, 2 September 2013, Pages 150-154
نویسندگان
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