کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9812348 | 1518111 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Perpendicular domains in poly(styrene-b-methyl methacrylate) block copolymer films on preferential surfaces
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The morphology of poly(styrene-block-methyl methacrylate) films was studied as a function of film thickness by atomic force microscopy and field emission scanning electron microscopy. The obtained morphologies were strongly dependent on the film thickness. Five different thickness regimes could be identified. Perpendicular polymethyl methacrylate cylindrical domains were obtained on Si/native oxide substrates without applying external electric field or surface treatments (hydrogen passivation, functionalized random copolymers, or self-assembled monolayers). The orientation of the domains formed by microphase separation was verified by pattern-transfer using reactive ion etching.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 488, Issues 1â2, 22 September 2005, Pages 329-336
Journal: Thin Solid Films - Volume 488, Issues 1â2, 22 September 2005, Pages 329-336
نویسندگان
H. Wang, A.B. DjuriÅ¡iÄ, M.H. Xie, W.K. Chan, O. Kutsay,