کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9813027 | 1518124 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Manganese distribution in ferromagnetic gallium manganese nitride epitaxial film grown by plasma enhanced molecular beam epitaxy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Systematic transmission electron microscopy (TEM) study was performed to determine the change in lattice parameter of epitaxial Mn-doped GaN films with low Mn contents (0.06-0.5 at.%) grown by plasma-enhanced molecular beam epitaxy (PEMBE) by which added Mn distribution can be investigated. Secondary ion mass spectroscopy (SIMS) reveals that the Mn profiles for the films are uniform throughout the entire thickness range of 0.7-1.0 μm with no appreciable segregation. The lattice parameter for the plasma-enhanced molecular beam epitaxy grown GaMnN is found to be a=0.31865 nm, larger than those for the metal organic chemical vapor deposition grown GaN used as a substrate and plasma-enhanced molecular beam epitaxy grown GaN on metal organic chemical vapor deposition GaN, reflecting the expansion of unit lattice due to Mn ion substitution for Ga ion in the wurtzite (GaxMn1âx)N structure. Lattice parameter measurement is believed to give useful information on the crystalline quality of (GaxMn1âx)N structure grown by plasma-enhanced molecular beam epitaxy.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 472, Issues 1â2, 24 January 2005, Pages 144-149
Journal: Thin Solid Films - Volume 472, Issues 1â2, 24 January 2005, Pages 144-149
نویسندگان
Joonyeon Chang, Gyeungho Kim, Woo-Young Lee, Jae-Min Myoung,