Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices Fulltext Access 5 Pages 2009
Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics Fulltext Access 5 Pages 2009
An investigation into the reliability of power modules considering baseplate solders thermal fatigue in aeronautical applications Fulltext Access 5 Pages 2009
Source electrode evolution of a low voltage power MOSFET under avalanche cycling Fulltext Access 5 Pages 2009
Capacitive RF MEMS analytical predictive reliability and lifetime characterization Fulltext Access 5 Pages 2009
A novel accelerated test technique for assessment of mechanical reliability of solder interconnects Fulltext Access 5 Pages 2009
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention Fulltext Access 5 Pages 2009
Analysis of humidity effects on the degradation of high-power white LEDs Fulltext Access 5 Pages 2009
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures Fulltext Access 5 Pages 2009
Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level Fulltext Access 5 Pages 2009
An advanced quality and reliability assessment approach applied to thermal stress issues in electronic components and assemblies Fulltext Access 5 Pages 2009
Electrical modeling of the effect of beam profile for pulsed laser fault injection Fulltext Access 5 Pages 2009
IR thermography and FEM simulation analysis of on-chip temperature during thermal-cycling power-metal reliability testing using in situ heated structures Fulltext Access 5 Pages 2009
The suppression of tin whisker growth by the coating of tin oxide nano particles and surface treatment Fulltext Access 5 Pages 2009
Characterisation method for chip card ESD events causing terminal failures Fulltext Access 5 Pages 2009
The influence of electron-beam irradiation on electrical characteristics of metal–insulator–semiconductor capacitors based on a high-k dielectric stack of HfTiSiO(N) and HfTiO(N) layers Fulltext Access 5 Pages 2009
Design of a novel fault-tolerant voter circuit for TMR implementation to improve reliability in digital circuits Fulltext Access 5 Pages 2009
Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions Fulltext Access 5 Pages 2009
Stability of the J–V characteristics of (BEHP-PPV)-co-(MEH-PPV) based light-emitting diodes Fulltext Access 5 Pages 2009
Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs Fulltext Access 5 Pages 2009
Modeling and characterization of molding compound properties during cure Fulltext Access 5 Pages 2009
A new methodology for the identification of ball bond degradation during high-temperature aging tests on devices in standard plastic packages Fulltext Access 5 Pages 2009
Towards elastic anisotropy and strain-induced void formation in Cu–Sn crystalline phases Fulltext Access 5 Pages 2009
Kirkendall voids formation in the reaction between Ni-doped SnAg lead-free solders and different Cu substrates Fulltext Access 5 Pages 2009
Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity Fulltext Access 5 Pages 2009
Two-stage hot-carrier degradation behavior of 0.18 μm 18 V n-type DEMOS and its recovery effect Fulltext Access 5 Pages 2009
Study on the performance of sub 100 nm LACLATI MOSFETs for digital application Fulltext Access 5 Pages 2009
Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors Fulltext Access 5 Pages 2009
Structure optimization of multi-finger power SiGe HBTs for thermal stability improvement Fulltext Access 5 Pages 2009
Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges Fulltext Access 5 Pages 2009
Comparison and evaluation of newest failure rate prediction models: FIDES and RIAC 217Plus Fulltext Access 5 Pages 2009
Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs Fulltext Access 5 Pages 2009
CMOS logic gate performance variability related to transistor network arrangements Fulltext Access 5 Pages 2009
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation Fulltext Access 5 Pages 2009
An algorithm for clock synchronization with the gradient property in sensor networks Fulltext Access 5 Pages 2009
Teleporter: An analytically and forensically sound duplicate transfer system Fulltext Access 5 Pages 2009
Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing Fulltext Access 5 Pages 2009
Mapping of nomadic multimedia applications on the ADRES reconfigurable array processor Fulltext Access 5 Pages 2009
Removal of post-etch photoresist and sidewall residues using organic solvent and additive combined with physical forces Fulltext Access 5 Pages 2009
Grid-based deployment and performance measurement of the Weather Research & Forecasting model Fulltext Access 5 Pages 2009
Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology Fulltext Access 5 Pages 2009
Percolation theory applied to PZT thin films capacitors breakdown mechanisms Fulltext Access 5 Pages 2009
Experimental study about gate oxide damages in patterned MOS capacitor irradiated with heavy ions Fulltext Access 5 Pages 2009
OptIPuter: Enabling advanced applications with novel optical control planes and backplanes Fulltext Access 5 Pages 2009
Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses Fulltext Access 5 Pages 2009
On the temperature and voltage dependence of short-term negative bias temperature stress Fulltext Access 5 Pages 2009
Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities Fulltext Access 5 Pages 2009
Investigating the CDM susceptibility of IC’s at package and wafer level by capacitive coupled TLP Fulltext Access 6 Pages 2009
A new two-dimensional subthreshold behavior model for the short-channel asymmetrical dual-material double-gate (ADMDG) MOSFET’s Fulltext Access 6 Pages 2009
CDM tests on interface test chips for the verification of ESD protection concepts Fulltext Access 6 Pages 2009
Intrinsic stress fracture energy measurements for PECVD thin films in the SiOxCyNz:H system Fulltext Access 6 Pages 2009
Prototyping of a reliable 3D flexible IC cube package by laser micromachining Fulltext Access 6 Pages 2009
Effect of Ag, Fe, Au and Ni on the growth kinetics of Sn–Cu intermetallic compound layers Fulltext Access 6 Pages 2009
Physical phenomena affecting performance and reliability of 4H–SiC bipolar junction transistors Fulltext Access 6 Pages 2009
Study of stress-induced leakage current (SILC) in HfO2/Dy2O3 high-κ gate stacks on germanium Fulltext Access 6 Pages 2009
Physical degradation of GaN HEMT devices under high drain bias reliability testing Fulltext Access 6 Pages 2009
Heat management for power converters in sealed enclosures: A numerical study Fulltext Access 6 Pages 2009
Investigation on marginal failure characteristics and related defects analysed by soft defect localization Fulltext Access 6 Pages 2009
Investigation of stress distribution in via bottom of Cu-via structures with different via form by means of submodeling Fulltext Access 6 Pages 2009
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package Fulltext Access 6 Pages 2009
A study of electrical characteristic changes in MOSFET by electron beam irradiation Fulltext Access 6 Pages 2009
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs Fulltext Access 6 Pages 2009
Behavior of hot carrier generation in power SOI LDNMOS with shallow trench isolation (STI) Fulltext Access 6 Pages 2009
Fabrication process simulation and reliability improvement of high-brightness LEDs Fulltext Access 6 Pages 2009
Microstructure evolution observation for SAC solder joint: Comparison between thermal cycling and thermal storage Fulltext Access 6 Pages 2009
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs Fulltext Access 6 Pages 2009
Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror Fulltext Access 6 Pages 2009
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions Fulltext Access 6 Pages 2009
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system Fulltext Access 6 Pages 2009
Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application Fulltext Access 6 Pages 2009
Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation Fulltext Access 6 Pages 2009
Effects of soft segment mixtures with different molecular weight on the properties and reliability of UV curable adhesives for electrodes protection of plasma display panel (PDP) Fulltext Access 6 Pages 2009
Study of gate dielectric permittivity variation with different equivalent oxide thickness on channel engineered deep sub-micrometer n-MOSFET device for mixed signal applications Fulltext Access 6 Pages 2009
Employing vertical dielectric layers to improve the operation performance of flash memory devices Fulltext Access 6 Pages 2009
Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method Fulltext Access 6 Pages 2009