A new two-dimensional threshold voltage model for cylindrical, fully-depleted, surrounding-gate (SG) MOSFETs Fulltext Access 5 Pages 2007
Long-term reliability of silicon bipolar transistors subjected to low constraints Fulltext Access 5 Pages 2007
Thermal approach of defects generation on copper/organic dielectric interface due to SEM inspections Fulltext Access 5 Pages 2007
Determination of transistor infant failure probability in InGaP/GaAs heterojunction bipolar technology Fulltext Access 5 Pages 2007
Preliminary reliability assessment and failure physical analysis on AlGaN/GaN HEMTs COTS Fulltext Access 5 Pages 2007
Reliability assessment for solders with a stress buffer layer using ball shear strength test and board-level finite element analysis Fulltext Access 5 Pages 2007
Sequential environmental stresses tests qualification for automotive components Fulltext Access 5 Pages 2007
Evidence that N2O is a stronger oxidizing agent than O2 for both Ta2O5 and bare Si below 1000 °C and temperature for minimum low-K interfacial oxide for high-K dielectric on Si Fulltext Access 5 Pages 2007
New developments of THERMOS3, a tool for 3D electro-thermal simulation of smart power MOSFETs Fulltext Access 5 Pages 2007
A case study of defects due to process marginalities in deep sub-micron technology Fulltext Access 5 Pages 2007
Numerical approach to characterization of thermally conductive adhesives Fulltext Access 5 Pages 2007
Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions Fulltext Access 5 Pages 2007
Correlation between chemistry of polymer building blocks and microelectronics reliability Fulltext Access 5 Pages 2007
Monitoring fading rate of ultracapacitors using online characterization during power cycling Fulltext Access 5 Pages 2007
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell Fulltext Access 5 Pages 2007
Performance and reliability improvement of flash device by a novel programming method Fulltext Access 5 Pages 2007
Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications Fulltext Access 5 Pages 2007
Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors Fulltext Access 5 Pages 2007
Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules Fulltext Access 5 Pages 2007
Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results Fulltext Access 5 Pages 2007
Analysis of hot carrier effects in a 0.35 μm high voltage n-channel LDMOS transistor Fulltext Access 5 Pages 2007
A novel SIMS based approach to the characterization of the channel doping profile of a trench MOSFET Fulltext Access 5 Pages 2007
Modeling of the breakdown mechanisms for porous copper/low-k process flows Fulltext Access 5 Pages 2007
Backend dielectric breakdown dependence on linewidth and pattern density Fulltext Access 5 Pages 2007
Single band electronic conduction in hafnium oxide prepared by atomic layer deposition Fulltext Access 5 Pages 2007
N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis Fulltext Access 5 Pages 2007
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation Fulltext Access 5 Pages 2007
The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth Fulltext Access 5 Pages 2007
Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests Fulltext Access 5 Pages 2007
Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress Fulltext Access 5 Pages 2007
High-temperature performance of state-of-the-art triple-gate transistors Fulltext Access 5 Pages 2007
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics Fulltext Access 5 Pages 2007
Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device Fulltext Access 5 Pages 2007
Enhanced finite element modelling of Cu electromigration using ANSYS and matlab Fulltext Access 5 Pages 2007
Room temperature observation of point defect on gold surface using thermovoltage mapping Fulltext Access 5 Pages 2007
Very wide current-regime operation of an InP/InGaAs tunneling emitter bipolar transistor (TEBT) Fulltext Access 5 Pages 2007
Localization of sensitive areas of power AC switch under thermal laser stimulation Fulltext Access 5 Pages 2007
First-principles study of the effects of oxygen vacancy on hole tunneling current Fulltext Access 5 Pages 2007
Application of time resolved emission techniques within the failure analysis flow Fulltext Access 5 Pages 2007
Improved low frequency noise characteristics of sub-micron MOSFETs with TaSiN/TiN gate on ALD HfO2 dielectric Fulltext Access 5 Pages 2007
Three-dimensional nanometric sub-surface imaging of a silicon flip-chip using the two-photon optical beam induced current method Fulltext Access 5 Pages 2007
Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations Fulltext Access 5 Pages 2007
Chip-on-Board (CoB) technology for low temperature environments. Part I: Wire profile modeling in unencapsulated chips Fulltext Access 5 Pages 2007
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices Fulltext Access 5 Pages 2007
Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs Fulltext Access 5 Pages 2007
On the difference between thermal cycling and thermal shock testing for board level reliability of soldered interconnections Fulltext Access 6 Pages 2007
Performance comparison of channel engineered deep sub-micrometer pseudo SOI n-MOSFETs Fulltext Access 6 Pages 2007
Organic thin film transistors with HfO2 high-k gate dielectric grown by anodic oxidation or deposited by sol–gel Fulltext Access 6 Pages 2007
Measurement of the transient junction temperature in MOSFET devices under operating conditions Fulltext Access 6 Pages 2007
Effect of stress voltages on voltage acceleration and lifetime projections for ultra-thin gate oxides Fulltext Access 6 Pages 2007
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach Fulltext Access 6 Pages 2007
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques Fulltext Access 6 Pages 2007
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs Fulltext Access 6 Pages 2007
Holding voltage investigation of advanced SCR-based protection structures for CMOS technology Fulltext Access 6 Pages 2007
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices Fulltext Access 6 Pages 2007
Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements Fulltext Access 6 Pages 2007
Reliability of interfacial adhesion in a multi-level copper/low-k interconnect structure Fulltext Access 6 Pages 2007
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications Fulltext Access 6 Pages 2007
Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy Fulltext Access 6 Pages 2007
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts Fulltext Access 6 Pages 2007
Reliability of semiconductor lasers used in current communication systems and sensing equipment Fulltext Access 6 Pages 2007
A study of metamorphic HEMT technological improvements: Impact on parasitic effect electrical models Fulltext Access 6 Pages 2007
Revisiting power cycling test for better life-time prediction in traction Fulltext Access 6 Pages 2007
Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles Fulltext Access 6 Pages 2007
Impact of strained-channel n-MOSFETs with a SiGe virtual substrate on dielectric interface quality evaluated by low frequency noise measurements Fulltext Access 6 Pages 2007
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs Fulltext Access 6 Pages 2007
Degradation behavior of 600 V–200 A IGBT modules under power cycling and high temperature environment conditions Fulltext Access 6 Pages 2007
Characterization and modelling of ageing failures on power MOSFET devices Fulltext Access 6 Pages 2007
Failure modes on low voltage power MOSFETs under high temperature application Fulltext Access 6 Pages 2007
Numerical analysis and comparative study of short circuit stress in IGBTs devices (IR, IXYS) Fulltext Access 6 Pages 2007
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities Fulltext Access 6 Pages 2007
A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation Fulltext Access 6 Pages 2007