Fabrication and characterisation of high quality ZnO thin films by reactive electron beam evaporation technique Fulltext Access 6 Pages 2005
Full wafer scale near zero residual nano-imprinting lithography using UV curable monomer solution Fulltext Access 6 Pages 2005
A new charge-trapping nonvolatile memory based on the re-oxidized nitrous oxide Fulltext Access 6 Pages 2005
Influence of the oxidation in the metal silicide/Si3N4 interfaces on the etching profile Fulltext Access 6 Pages 2005
Fabrication of vacuum tube arrays with a sub-micron dimension using anodic aluminum oxide nano-templates Fulltext Access 6 Pages 2005
Study of PECVD SiOxNy films dielectric properties with different nitrogen concentration utilizing MOS capacitors Fulltext Access 6 Pages 2005
Application of the Taguchi's design of experiments to optimize a bromine chemistry-based etching recipe for deep silicon trenches Fulltext Access 6 Pages 2005
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect Fulltext Access 6 Pages 2005
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime Fulltext Access 6 Pages 2005
Investigation of electromagnetic radiation induced by conducting wire of nanometer multi-quantum well device on InGaN LED Fulltext Access 6 Pages 2005
Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach Fulltext Access 6 Pages 2005
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability Fulltext Access 6 Pages 2005
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue Fulltext Access 6 Pages 2005
Assessment of the Trench IGBT reliability: low temperature experimental characterization Fulltext Access 6 Pages 2005
Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles Fulltext Access 6 Pages 2005
Automated setup for thermal imaging and electrical degradation study of power DMOS devices Fulltext Access 6 Pages 2005
Moisture diffusion in Printed Circuit Boards: Measurements and Finite- Element- Simulations Fulltext Access 6 Pages 2005
Nanomanipulation and aggregation limitations of self-assembling structural proteins Fulltext Access 6 Pages 2005
Roughness of amorphous/crystalline interface in pre-amorphization implantation: Molecular dynamic simulation and modeling Fulltext Access 6 Pages 2005
Enhanced current gain in SiC power BJTs using a novel surface accumulation layer transistor concept Fulltext Access 6 Pages 2005
Air-bridge interconnection and bondpad process for non-planar compound semiconductor devices Fulltext Access 6 Pages 2005
Correlation between Experimental Results and FE Simulations to Evaluate Lead-Free BGA Assembly Reliability Fulltext Access 6 Pages 2005
Ferroelectric and leakage current characteristics of (Pb0.72La0.28)Ti0.93O3 thin films prepared by a sol-gel process Fulltext Access 6 Pages 2005
Detection of open or closed porosity in low-κ dielectrics by solvent diffusion Fulltext Access 6 Pages 2005
Studies of Ti- and Ni-germanide Schottky contacts on n-Ge(1Â 0Â 0) substrates Fulltext Access 6 Pages 2005
Cubic InGaN/GaN multi-quantum wells and AlGaN/GaN distributed Bragg reflectors for application in resonant cavity LEDs Fulltext Access 6 Pages 2005
The numerical solution of physical problems modeled as a systems of differential-algebraic equations (DAEs) Fulltext Access 6 Pages 2005
Gate stress effect on low temperature data retention characteristics of split-gate flash memories Fulltext Access 6 Pages 2005
Investigation on seal-ring rules for IC product reliability in 0.25-μm CMOS technology Fulltext Access 6 Pages 2005
Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models Fulltext Access 6 Pages 2005
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability Fulltext Access 6 Pages 2005
Excited states and infrared transition energies of a donor impurity in cylindrical GaAs-Ga0.6Al0.4As quantum well wires under the action of an applied magnetic field Fulltext Access 6 Pages 2005
Oxygen pressure dependence of physical and electrical properties of LaAlO3 gate dielectric Fulltext Access 6 Pages 2005
Simultaneous suppression of overlap errors and side-lobes in attenuated PSM lithography by rule-based OPC Fulltext Access 6 Pages 2005
The 2004 Benjamin Franklin Medal in Chemistry presented to Harry B. Gray Fulltext Access 6 Pages 2005
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs Fulltext Access 6 Pages 2005
Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials Fulltext Access 6 Pages 2005
Pt-implanted boron-doped diamond electrodes and the application for electrochemical detection of hydrogen peroxide Fulltext Access 6 Pages 2005
Influences of bias voltage on properties of TiAl-doped DLC coatings synthesized by cathodic arc evaporation Fulltext Access 6 Pages 2005
Array geometry, size and spacing effects on field emission characteristics of aligned carbon nanotubes Fulltext Access 6 Pages 2005
Effects of various post-treatments on carbon nanotube films for reliable field emission Fulltext Access 6 Pages 2005
Transparent conductive film based on carbon nanotubes and PEDOT composites Fulltext Access 6 Pages 2005
The growth of carbon nanotubes at the channel ends of the SAPO4-5 zeolite structures Fulltext Access 6 Pages 2005
Boron doped amorphous carbon thin films grown by r.f. PECVD under different partial pressure Fulltext Access 6 Pages 2005
Microwave plasma chemical vapor deposition of cone-like structure of diamond/SiC/Si on Si (100) Fulltext Access 6 Pages 2005
High-quality homoepitaxial diamond (100) films grown under high-rate growth condition Fulltext Access 6 Pages 2005
Innovative packaging technique for backside optical testing of wire-bonded chips Fulltext Access 6 Pages 2005
Isolating failing sites in IC packages using time domain reflectometry: Case studies Fulltext Access 6 Pages 2005
Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions Fulltext Access 6 Pages 2005
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations Fulltext Access 6 Pages 2005
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices Fulltext Access 6 Pages 2005
Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products Fulltext Access 6 Pages 2005
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast Fulltext Access 6 Pages 2005
Fast and effective generation of the proposal distribution for particle filters Fulltext Access 6 Pages 2005
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout Fulltext Access 6 Pages 2005
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis Fulltext Access 6 Pages 2005
Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects Fulltext Access 6 Pages 2005
Effect of test condition and stress free temperature on the electromigration failure of Cu dual damascene submicron interconnect line-via test structures Fulltext Access 6 Pages 2005
ESD circuit model based protection network optimisation for extended-voltage NMOS drivers Fulltext Access 6 Pages 2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure Fulltext Access 6 Pages 2005
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs Fulltext Access 6 Pages 2005
Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs Fulltext Access 6 Pages 2005
Hot-carrier reliability of 20V MOS transistors in 0.13 μm CMOS technology Fulltext Access 6 Pages 2005