
																
																	Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)
																
																
																
															Keywords: میکروسکوپ نیروی اتمی; Atomic force microscopy (AFM); X-ray photoelectron spectroscopy (XPS); Electron affinity;