Keywords: طیف سنجی جرم یونی ثانویه; GCIB; Cluster ion beam; Mass filter; Rotating electric field; Secondary ion mass spectroscopy;
مقالات ISI طیف سنجی جرم یونی ثانویه (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: طیف سنجی جرم یونی ثانویه; Spectroscopic Ellipsometry; Boron-doped diamond; Microwave plasma enhanced chemical vapor deposition; Secondary ion mass spectroscopy;
Keywords: طیف سنجی جرم یونی ثانویه; Raman spectroscopy; Amorphous silicon; Hydrogen; Microstructure; Fourier transform infrared spectroscopy; Secondary ion mass spectroscopy; Solar cells;
Keywords: طیف سنجی جرم یونی ثانویه; X-ray reflectivity; Polarized neutron reflectivity; Interdiffusion; Self-diffusion; Intermetallic alloy phases; Annealing; Diffusion length; Solid state reaction; Activation energy for diffusion; Ni/Al, Ni/Ti and Ni/Ge multilayers; XRD; X-ray diffraction;
Keywords: طیف سنجی جرم یونی ثانویه; Hydrogen characterization; Sieverts technique; Gravimetric technique; Secondary ion mass spectroscopy; Thermal desorption spectroscopy; Neutron scattering; Electrochemical techniques;
Keywords: طیف سنجی جرم یونی ثانویه; Plasma Immersion Ion Implantation; Secondary ion mass spectroscopy; X-ray photo-electron spectroscopy; Positron annihilation spectroscopy; Point defect;
Keywords: طیف سنجی جرم یونی ثانویه; Titanium hydride; Pulsed ion beam; XRD; Secondary ion mass spectroscopy;
Diffusion and influence on photovoltaic characteristics of p-type dopants in organic photovoltaics for energy harvesting from blue-light
Keywords: طیف سنجی جرم یونی ثانویه; P-type doping; BPh-BTBT; Blue-light absorbing solar cell; Secondary ion mass spectroscopy;
Structural, chemical and optical properties of cerium dioxide film prepared by atomic layer deposition on TiN and Si substrates
Keywords: طیف سنجی جرم یونی ثانویه; Atomic layer deposition; Ceria microstructure; Grain size; X-ray diffraction; Atomic force microscopy; Secondary ion mass spectroscopy; X-ray photo-electron spectroscopy; Spectroscopic ellipsometry;
Lipidomics, en route to accurate quantitation
Keywords: طیف سنجی جرم یونی ثانویه; LE; liquid extraction; MTBE; methyl-tert-butyl ether; BUME; butanol/methanol; S1P; sphingosine-1-phosphate; FFA; free fatty acids; PAs; phosphatidic acids; PIPs; phosphoinositides; LPS; lipopolysaccharide; SDS; sodium dodecyl sulfate; MAs; myolic acids; S
Investigation of factors limiting efficiency in Cu(In,Ga)Se2 thin film solar cells during rapid evaporation process
Keywords: طیف سنجی جرم یونی ثانویه; Thin films; Rapid evaporation; Copper indium gallium Selenide; Solar cell efficiency; Residual phases; Raman spectroscopy; Sodium diffusion; Secondary ion mass spectroscopy;
Oxygen and erbium distribution in diffusion doped silicon
Keywords: طیف سنجی جرم یونی ثانویه; Diffusion doping; Oxygen; Erbium; Oxide films; Secondary ion mass spectroscopy;
The oxidation effect of a Mo back contact on Cu(In,Ga)(Se,S)2 thin-film solar modules
Keywords: طیف سنجی جرم یونی ثانویه; BZO; boron-doped zinc oxide; CBD; chemical bath deposition; CIGSS; copper-indium-gallium-sulfur selenide, Cu(In,Ga)(Se,S)2; FF; fill factor; IR imaging; infrared imaging; LPCVD; low-pressure chemical vapor deposition; SEM; scanning electron microsco
Improving the work function of the niobium surface of SRF cavities by plasma processing
Keywords: طیف سنجی جرم یونی ثانویه; SRF cavity; Plasma processing; Surface science; Hydrocarbons removal; Niobium surface; Secondary Ion Mass Spectroscopy; Scanning kelvin probe; Work function;
A study on the applicability of Si in low-Mo duplex stainless steel weld metals to improve the corrosion resistance
Keywords: طیف سنجی جرم یونی ثانویه; Welding; Secondary ion mass spectroscopy; Stainless steels; Corrosion; Silicon
Impact of DC-power during Mo back contact sputtering on the alkali distribution in Cu(In,Ga)Se2-based thin film solar cells
Keywords: طیف سنجی جرم یونی ثانویه; Solar cells; Copper indium gallium diselenide; Alkali; Secondary ion mass spectroscopy; DC-sputtering; Molybdenum;
Investigation of dielectric relaxation and ac electrical conductivity using impedance spectroscopy method in (AuZn)/TiO2/p-GaAs(1Â 1Â 0) schottky barrier diodes
Keywords: طیف سنجی جرم یونی ثانویه; TiO2/GaAs(1Â 1Â 0); X-ray diffraction; Secondary ion mass spectroscopy; Atomic force microscope; Frequency and voltage dependence; Dielectric relaxation; Electric modulus;
Na effect on flexible Cu(In,Ga)Se2 photovoltaic cell depending on diffusion barriers (SiOx, i-ZnO) on stainless steel
Keywords: طیف سنجی جرم یونی ثانویه; Chalcogenides; Thin films; Secondary ion mass spectroscopy; Diffusion
Electrical characteristics of electroless gold contacts on p-type Hg1−xCdxTe
Keywords: طیف سنجی جرم یونی ثانویه; HgCdTe; Electroless gold; Transfer length method; Secondary ion mass spectroscopy; Current transport
Evidence of strong acceptor peaks in ZnO thin films doped with phosphorus by plasma immersion ion implantation technique
Keywords: طیف سنجی جرم یونی ثانویه; Zinc Oxide; Plasma immersion ion implantation; Scanning electron microscopy; Photoluminescence; Secondary ion mass spectroscopy;
Chemical evolution of InP/InGaAs/InGaAsP microstructures irradiated in air and deionized water with ArF and KrF lasers
Keywords: طیف سنجی جرم یونی ثانویه; Quantum well intermixing; InP/InGaAs/InGaAsP microstructures; ArF and KrF excimer laser irradiation; X-ray photoelectron spectroscopy; Secondary ion mass spectroscopy; Indium and InP oxides;
Intergranular crack tip oxidation in a Ni-base superalloy
Keywords: طیف سنجی جرم یونی ثانویه; Oxygen; Diffusion; Atom probe tomography; Transmission electron microscopy; Secondary ion mass spectroscopy
Scaling effects on grain boundary diffusivity; Au in Cu
Keywords: طیف سنجی جرم یونی ثانویه; Grain boundary diffusion; Nanocrystalline microstructure; Secondary ion mass spectroscopy; Scanning/transmission electron microscopy; Copper alloys
Morphological, optical and electrical properties of samarium oxide thin films
Keywords: طیف سنجی جرم یونی ثانویه; Samarium oxide; Thin films; Radio-frequency pulsed laser deposition; Atomic force microscopy; Secondary ion mass spectroscopy; Optical properties
Impact of a-Si:H hydrogen depth profiles on passivation properties in a-Si:H/c-Si heterojunctions
Keywords: طیف سنجی جرم یونی ثانویه; Amorphous silicon; Surface passivation; Heterojunctions; Photovoltaics; Plasma-enhanced chemical vapor deposition; Secondary ion mass spectroscopy
Improved microstructure and ohmic contact of Nb electrode on n-type 4H-SiC
Keywords: طیف سنجی جرم یونی ثانویه; Niobium; Silicon carbide; Interfacial reaction; Ohmic contact; X-ray diffraction; Secondary ion mass spectroscopy; Raman spectroscopy
Enhancement of microcrystalline n-i-p solar cell performance via use of pre-covering layers and H2 treatment
Keywords: طیف سنجی جرم یونی ثانویه; Microcrystalline silicon; Covering layer; Diffusion barrier; Plasma-enhanced chemical vapor deposition; Secondary ion mass spectroscopy; Raman spectroscopy;
Enhancement of photoluminescence in Er-doped Ag–SiO2 nanocomposite thin films: A post annealing study
Keywords: طیف سنجی جرم یونی ثانویه; Photoluminescence; Rutherford backscattering spectroscopy; Secondary ion mass spectroscopy
Electrodeposition of PEDOT-Cl film on a fully printed Ag/polyaniline electrode
Keywords: طیف سنجی جرم یونی ثانویه; Electrochemical deposition; Poly(3,4-ethylenedioxythiophene); Polyaniline; Paper; Conductive ink; Inkjet printing; Secondary Ion Mass Spectroscopy; Atomic force microscopy
Electrical, optical and surface properties of P2S5/(NH4)2Sx+ Se-treated doped-channel field-effect transistors with double etch-stop layers
Keywords: طیف سنجی جرم یونی ثانویه; X-ray photoelectron spectroscopy; Secondary ion mass spectroscopy; Photoluminescence; Doped-channel field-effect transistor; Molecular beam epitaxy; Passivation
Surface and interface effects on structural transformation of vapor-deposited ethylbenzene films
Keywords: طیف سنجی جرم یونی ثانویه; Secondary ion mass spectroscopy; Low energy ion scattering (LEIS); Surface diffusion; Surface melting; Wetting; Aromatics; Water; Glass surfaces; Liquid surfaces; Solid-liquid interfaces; Glassy thin films;
Influence of clusters on Bi LMIS properties
Keywords: طیف سنجی جرم یونی ثانویه; Liquid metal ion source; Coulomb interactions; Secondary ion mass spectroscopy
Structural and optical properties of RF magnetron sputtered aluminum nitride films without external substrate heating
Keywords: طیف سنجی جرم یونی ثانویه; Aluminum nitride film; RF magnetron sputtering; X-ray diffraction; High resolution transmission electron microscopy; Secondary ion mass spectroscopy; Optical properties;
Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry
Keywords: طیف سنجی جرم یونی ثانویه; Secondary ion mass spectroscopy; Organic films; Thin films; Phase separation; Cyanine dye; Film morphology
Surface segregation in binary mixtures of imidazolium-based ionic liquids
Keywords: طیف سنجی جرم یونی ثانویه; Secondary ion mass spectroscopy; Surface segregation; Liquid surfaces;
The characteristics of fluorinated polycrystalline silicon oxides and thin film transistors by CF4 plasma treatment
Keywords: طیف سنجی جرم یونی ثانویه; Plasma treatment; Fluorinated polyoxides; Thin film transistors; Secondary ion mass spectroscopy;
Improvement of the properties and electrical performance on TiCl4-based TiN film using sequential flow chemical vapor deposition process
Keywords: طیف سنجی جرم یونی ثانویه; Titanium nitride; Chemical vapor deposition; Metal organic chemical vapor deposition; Titanium chloride; Secondary ion mass spectroscopy; Transmission electron microscopy
Pulsed laser deposited alumino-silicate thin films and amorphous chalcogenide/alumino-silicate structures
Keywords: طیف سنجی جرم یونی ثانویه; Amorphous materials; Alumino-silicates; Chalcogenide glasses; Optical properties; Pulsed laser deposition; X-ray diffraction; Secondary Ion Mass Spectroscopy
Oxygen plasma activation of Cr(CO)6 on α-Fe2O3(0001)
Keywords: طیف سنجی جرم یونی ثانویه; Low energy electron diffraction (LEED); Thermal desorption spectroscopy; Secondary ion mass spectroscopy; Growth; Thermal desorption; Iron oxide; Chromium oxide; Chromium hexacarbonyl;
Pulsed laser deposition-induced reduction of SrTiO3 crystals
Keywords: طیف سنجی جرم یونی ثانویه; Perovskites; Thin-films; Laser deposition; Electrical resistivity; Secondary ion mass spectroscopy
Sputter-deposited Cu/Cu(O) multilayers exhibiting enhanced strength and tunable modulus
Keywords: طیف سنجی جرم یونی ثانویه; Sputtering deposition; Multilayer thin film; Nanoindentation; AES; Secondary ion mass spectroscopy;
Could a dysfunction of ferritin be a determinant factor in the aetiology of some neurodegenerative diseases?
Keywords: طیف سنجی جرم یونی ثانویه; Aβ; Amyloid beta peptide; AD; Alzheimer's disease; ATEM; Analytical transmission electron microscopy; CAT; Computed axial tomography; ED; Electron diffraction; EELS; Electron energy loss spectrometry; END; Electron nanodiffraction; EXAFS; Extended X-ray
Silver and gold doping of SiO2 glass by solid-state field-assisted diffusion
Keywords: طیف سنجی جرم یونی ثانویه; 81.05.Pj; 66.30.Qa; 66.30.−h; 42.82.EtIon exchange; Secondary ion mass spectroscopy; Silica
Nitrogen-doped p-type ZnO thin films and ZnO/ZnSe p-n heterojunctions grown on ZnSe substrate by radical beam gettering epitaxy
Keywords: طیف سنجی جرم یونی ثانویه; Zinc oxide; X-ray diffraction; Atomic force microscopy; Secondary ion mass spectroscopy; Nitrogen doping; Photoluminescence; Hall-effect measurements
Oxidation resistance of nanocrystalline vis-à-vis microcrystalline Fe–Cr alloys
Keywords: طیف سنجی جرم یونی ثانویه; Nanocrystalline Fe–Cr alloys; Ball milling; Grain growth; Oxide film; Secondary ion mass spectroscopy
Comparative depth-profiling analysis of nanometer-metal multilayers by ion-probing techniques
Keywords: طیف سنجی جرم یونی ثانویه; Depth profiling; Elemental analysis; GDOES; Glow-discharge optical emission spectroscopy; Ion probing; Multilayer; RBS; Rutherford backscattering spectrometry; Secondary ion mass spectroscopy; SIMS
Investigation of gel porosity clogging during glass leaching
Keywords: طیف سنجی جرم یونی ثانویه; 61.43.Fs; 68.49.Sf; 68.35FxCorrosion; Secondary ion mass spectroscopy; Borosilicates
Atomic diffusion of boron and other constituents in amorphous Si–B–C–N
Keywords: طیف سنجی جرم یونی ثانویه; 66.30.Hs; 71.23.Cq; 82.80.MsAmorphous semiconductors; Diffusion and transport; Glasses; Secondary ion mass spectroscopy
Secondary ion emission from Ti and Si targets induced by medium energy Ar+ ion bombardment - Experiment and computer simulation
Keywords: طیف سنجی جرم یونی ثانویه; Sputtering; Ion implantation; Secondary ion mass spectroscopy; Ion-solid interaction;
Trap-limited diffusion of hydrogen in precursor derived amorphous Si–B–C–N-ceramics
Keywords: طیف سنجی جرم یونی ثانویه; 81.05.Je; 66.30.−h; 78.55.QrAmorphous semiconductors; Silicon; Ceramics; Diffusion and transport; Carbon; Silicon carbide; Secondary ion mass spectroscopy