On-line monitoring of solar cell module production by ellipsometry technique

Off-line point-by-point mapping can be effective for characterization of non-uniformities in full scale PV panels in developing labs but it is slow in the on-line mode when only 15 points can be obtained (within 1 min) as a 120 cm long panel moves by the mapping station. In the last years [M. Fried et al., Thin Solid Films 519, 2730 (2011)], instrumentation was developed that provides a line image of spectroscopic ellipsometry (wl = 350-1000 nm) data. Up to now a single 30 point line image can be collected in 10 s over a 15 cm width of PV material. This year we are building a 30 and a 60 cm width expanded beam ellipsometer the speed of which will be increased by 10 ×. Then 1800 points can be mapped in a 1 min traverse of a 60 ∗ 120 cm PV panel or flexible roll-to-roll substrate.