کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1671781 | 1008923 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Native oxide consumption during the atomic layer deposition of TiO2 films on GaAs (100) surfaces
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Native oxide consumption during the atomic layer deposition of TiO2 films on GaAs (100) surfaces Native oxide consumption during the atomic layer deposition of TiO2 films on GaAs (100) surfaces](/preview/png/1671781.png)
چکیده انگلیسی
The consumption of the surface native oxides is studied during the atomic layer deposition of TiO2 films on GaAs (100) surfaces. Films are deposited at 200 °C from tetrakis dimethyl amido titanium and H2O. Transmission electron microscopy data show that the starting surface consists of ~2.6 nm of native oxide and X-ray photoelectron spectroscopy indicates a gradual reduction in the thickness of the oxide layer as the thickness of the TiO2 film increases. Approximately 0.1–0.2 nm of arsenic and gallium suboxide is detected at the interface after 250 process cycles. For depositions on etched GaAs surfaces no interfacial oxidation is observed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 518, Issue 8, 1 February 2010, Pages 2006–2009
Journal: Thin Solid Films - Volume 518, Issue 8, 1 February 2010, Pages 2006–2009
نویسندگان
Theodosia Gougousi, John W. Lacis,