کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1672089 | 1008928 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High throughput screening of piezoelectric response of ferroelectric thin films with automated scanning probe microscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
A high throughput screening method was developed for automatic measurements of ferroelectric thin film samples with piezoresponse force microscopy. Libraries of samples with varying chemical compositions, produced with high throughput experimentation via the sol–gel route, were examined and piezoresponse images were recorded. A procedure was designed to calculate figures of merit that are related to the piezoelectric coefficient d33. They were used to identify the most promising samples within a combinatorial library. The method was evaluated through comparison with macroscopic permittivity measurements.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 516, Issue 23, 1 October 2008, Pages 8609–8612
Journal: Thin Solid Films - Volume 516, Issue 23, 1 October 2008, Pages 8609–8612
نویسندگان
Ralf-Peter Herber, Christian Schröter, Berit Wessler, Gerold A. Schneider,