کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1672869 1008941 2008 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Structural and optical properties of pulsed laser deposited V2O5 thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Structural and optical properties of pulsed laser deposited V2O5 thin films
چکیده انگلیسی

Pulsed laser deposited nanocrystalline V2O5 thin films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), high-resolution transmission electron microscopy (HRTEM) and optical spectroscopy. The films were deposited on amorphous glass substrates, keeping the O2 partial pressure at 13.33 Pa and the substrate temperature at 220 °C. The characteristics of the films were changed by varying the laser fluence and repetition rate. XRD revealed that films are nanocrystalline with an orthorhombic structure. XPS shows the sub-stoichiometry of the films, that generally relies on the fact that during the formation process of V2O5 films, lower valence oxides are also created. From the HRTEM images, we observed the size evolution and distribution characteristics of the clusters in the function of the laser fluence. From the spectral transmittance we determined the absorption edge using the Tauc plot. Calculation of the Bohr radius for V2O5 is also reported.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 516, Issue 15, 2 June 2008, Pages 4659–4664
نویسندگان
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