کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8032456 | 1517950 | 2018 | 23 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Method to reduce the formation of crystallites in ZnO nanorod thin-films grown via ultra-fast microwave heating
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
This paper discusses the nucleation and growth mechanisms of ZnO nanorod thin-films and larger sized crystallites that form within the solution and on surfaces during an ultra-fast microwave heating growth process. In particular, the work focusses on the elimination of crystallites as this is necessary to improve thin-film uniformity and to prevent electrical short circuits between electrodes in device applications. High microwave power during the early stages of ZnO deposition was found to be a key factor in the formation of unwanted crystallites on substrate surfaces. Once formed, the crystallites, grow at a much faster rate than the nanorods and quickly dominate the thin-film structure. A new two-step microwave heating method was developed that eliminates the onset of crystallite formation, allowing the deposition of large-area nanorod thin-films that are free from crystallites. A dissolution-recrystallization mechanism is proposed to explain why this procedure is successful and we demonstrate the importance of the work in the fabrication of low-cost memristor devices.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 662, 30 September 2018, Pages 116-122
Journal: Thin Solid Films - Volume 662, 30 September 2018, Pages 116-122
نویسندگان
R.J. Gray, Ayoub H. Jaafar, E. Verrelli, N.T. Kemp,