Growth and opto-electro-structural properties of nanocrystalline PbSe thin films

The present work deals with the structural, optical and electrical characterization of PbSe thin films with variable thickness deposited on well-cleaned glass substrates by electron beam evaporation technique at room temperature (RT). Grown films are characterized by X-ray diffraction, energy dispersive spectroscopy, resistivity measurements (from room temperature to 200 °C) and optical measurements at room temperature in order to study their various properties. The optical constants (namely, absorption coefficient, the refractive index, extinction coefficient, real and imaginary part of dielectric constant) have been studied for as-deposited PbSe thin films as a function of photon energy in the wavelength range 400-2500 nm at RT. The thickness dependence of optical constants was discussed.