Dry oxidation of MBE-SiGe films: rate enhancement, Ge redistribution and defect injection Fulltext Access 6 Pages 2005
Fabrication and characterisation of high quality ZnO thin films by reactive electron beam evaporation technique Fulltext Access 6 Pages 2005
Phosphorus diffusion in Si-based resonant interband tunneling diodes and tri-state logic using vertically stacked diodes Fulltext Access 6 Pages 2005
Fabrication of strained Si nMOSFET transistors on thin buffer layers with selective and non-selective epitaxial growth techniques Fulltext Access 6 Pages 2005
A simple electrical approach to extracting the difference in bandgap across neutral base for SiGe HBT's Fulltext Access 6 Pages 2005
Spectroscopic ellipsometry for in-line process control of SiGe:C HBT technology Fulltext Access 6 Pages 2005
Simultaneous optical measurement of Ge content and Boron doping in strained epitaxial films using a novel data-analysis technique Fulltext Access 6 Pages 2005
Investigation of electromagnetic radiation induced by conducting wire of nanometer multi-quantum well device on InGaN LED Fulltext Access 6 Pages 2005
A high throughput, ultra-low roughness, SiGe-free strained Si regrowth process Fulltext Access 6 Pages 2005
TSUPREM-4 based modeling of boron and carbon diffusion in SiGeC base layers under rapid thermal annealing conditions Fulltext Access 6 Pages 2005
Kinetic formation and optical properties of self-assembled Ge/Si hut clusters Fulltext Access 6 Pages 2005
Improvement in epitaxial quality of selectively grown Si1âxGex layers with low pattern sensitivity for CMOS applications Fulltext Access 6 Pages 2005
Monolithic active pixel sensor realized in SOI technology-concept and verification Fulltext Access 6 Pages 2005
Lateral punch-through TVS devices for on-chip protection in low-voltage applications Fulltext Access 6 Pages 2005
Effect of localized traps on the anomalous behavior of the transconductance in nanocrystalline TFTs Fulltext Access 6 Pages 2005
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect Fulltext Access 6 Pages 2005
Influence of rapid thermal annealing on morphological and electrical properties of RF sputtered AlN films Fulltext Access 6 Pages 2005
WSix/WN/polysilicon DRAM gate stack with a 50Â Ã WN layer as a diffusion barrier and an etch stop Fulltext Access 6 Pages 2005
Generalization of Einstein relation for organic semiconductor thin films Fulltext Access 6 Pages 2005
Influence of nitrogen annealing on structural and photoluminescent properties of ZnO thin film grown on c-Al2O3 by atmospheric pressure MOCVD Fulltext Access 6 Pages 2005
Formation of gold nanoparticles supported on carbon nanotubes by using an electroless plating method Fulltext Access 6 Pages 2005
The effect of negative bias pulse on the bonding configurations and properties of DLC films prepared by PBII with acetylene Fulltext Access 6 Pages 2005
Effect of diamond types on textured surface morphology and magnetic performance in hard disk Fulltext Access 6 Pages 2005
Microwave plasma enhanced chemical vapor deposition of diamond in silicon pores Fulltext Access 6 Pages 2005
Raman microscopic characterization of proton-irradiated polycrystalline diamond films Fulltext Access 6 Pages 2005
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime Fulltext Access 6 Pages 2005
Nanomanipulation and aggregation limitations of self-assembling structural proteins Fulltext Access 6 Pages 2005
Cubic InGaN/GaN multi-quantum wells and AlGaN/GaN distributed Bragg reflectors for application in resonant cavity LEDs Fulltext Access 6 Pages 2005
Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs Fulltext Access 6 Pages 2005
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast Fulltext Access 6 Pages 2005
Innovative packaging technique for backside optical testing of wire-bonded chips Fulltext Access 6 Pages 2005
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout Fulltext Access 6 Pages 2005
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis Fulltext Access 6 Pages 2005
Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects Fulltext Access 6 Pages 2005
Effect of test condition and stress free temperature on the electromigration failure of Cu dual damascene submicron interconnect line-via test structures Fulltext Access 6 Pages 2005
ESD circuit model based protection network optimisation for extended-voltage NMOS drivers Fulltext Access 6 Pages 2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure Fulltext Access 6 Pages 2005
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs Fulltext Access 6 Pages 2005
Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products Fulltext Access 6 Pages 2005
Hot-carrier reliability of 20V MOS transistors in 0.13 μm CMOS technology Fulltext Access 6 Pages 2005
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs Fulltext Access 6 Pages 2005
Gate stress effect on low temperature data retention characteristics of split-gate flash memories Fulltext Access 6 Pages 2005
Investigation on seal-ring rules for IC product reliability in 0.25-μm CMOS technology Fulltext Access 6 Pages 2005
Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models Fulltext Access 6 Pages 2005
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability Fulltext Access 6 Pages 2005
Excited states and infrared transition energies of a donor impurity in cylindrical GaAs-Ga0.6Al0.4As quantum well wires under the action of an applied magnetic field Fulltext Access 6 Pages 2005
Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach Fulltext Access 6 Pages 2005
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability Fulltext Access 6 Pages 2005
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue Fulltext Access 6 Pages 2005
Assessment of the Trench IGBT reliability: low temperature experimental characterization Fulltext Access 6 Pages 2005
Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles Fulltext Access 6 Pages 2005
Automated setup for thermal imaging and electrical degradation study of power DMOS devices Fulltext Access 6 Pages 2005
Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials Fulltext Access 6 Pages 2005
Moisture diffusion in Printed Circuit Boards: Measurements and Finite- Element- Simulations Fulltext Access 6 Pages 2005
Correlation between Experimental Results and FE Simulations to Evaluate Lead-Free BGA Assembly Reliability Fulltext Access 6 Pages 2005
Isolating failing sites in IC packages using time domain reflectometry: Case studies Fulltext Access 6 Pages 2005
Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions Fulltext Access 6 Pages 2005
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations Fulltext Access 6 Pages 2005
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices Fulltext Access 6 Pages 2005