کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1668389 1008869 2011 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Structural characterization and porosity analysis in self-supported porous alumina-silica thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Structural characterization and porosity analysis in self-supported porous alumina-silica thin films
چکیده انگلیسی

In this study, alumina, silica and alumina-silica binary (36% mol silica) thin films are synthesized using the sol-gel technique. These form the basis for future gas separation membranes. The characterization of the synthesized oxides was performed using nitrogen physisorption, X-ray diffraction (XRD), Doppler-broadening measurements on the 511 keV annihilation photon peak, together with 3γ/2γ analysis, and Fourier transform infrared spectroscopy (FTIR) of adsorbed CO. It is found that silica is microporous, γ-alumina is mesoporous, and the binary material shows fingerprints of both the meso- and microporous nature of its constituents as well as of the respective crystal structures. These results open the possibility to also investigate thin supported porous films (a few microns thick), and especially the setting and drying aspects on porous supports for membrane production, using the positron annihilation technique.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 520, Issue 1, 31 October 2011, Pages 30–34
نویسندگان
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