High-K dielectric deposition in 3D architectures: The case of Ta2O5 deposited with metal–organic precursor TBTDET Fulltext Access 4 Pages 2007
Optimization and performance of Al2O3/GaN metal–oxide–semiconductor structures Fulltext Access 4 Pages 2007
High quality gate insulator film formation on SiC using by microwave-excited high-density plasma Fulltext Access 4 Pages 2007
The influence of hydrogen and nitrogen on the formation of Si nanoclusters embedded in sub-stoichiometric silicon oxide layers Fulltext Access 4 Pages 2007
Improved electrical properties using SrTiO3/Y2O3 bilayer dielectrics for MIM capacitor applications Fulltext Access 4 Pages 2007
Development of a permittivity extraction method for ultra low k dielectrics integrated in advanced interconnects Fulltext Access 4 Pages 2007
Development of embedded capacitor with bismuth-based pyrochlore thin films at low temperatures for printed circuit board applications Fulltext Access 4 Pages 2007
Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition Fulltext Access 4 Pages 2007
Charge trapping and interface states in hydrogen annealed HfO2–Si structures Fulltext Access 4 Pages 2007
Optical characterization of Si-rich silicon nitride films prepared by low pressure chemical vapor deposition Fulltext Access 4 Pages 2007
Test structures for dielectric spectroscopy of thin films at microwave frequencies Fulltext Access 4 Pages 2007
Extracting the relative dielectric constant for “high-κ layers” from CV measurements – Errors and error propagation Fulltext Access 4 Pages 2007
Application of an MOS tunnel transistor for measurements of the tunneling parameters and of the parameters of electron energy relaxation in silicon Fulltext Access 4 Pages 2007
Worn-out oxide MOSFET characteristics: Role of gate current and device parameters on a current mirror Fulltext Access 4 Pages 2007
Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics Fulltext Access 4 Pages 2007
Effective work function of NiSi/HfO2 gate stacks measured with X-ray photoelectron spectroscopy Fulltext Access 4 Pages 2007
The characterization of retention properties of metal–ferroelectric (PbZr0.53Ti0.47O3)–insulator (Dy2O3, Y2O3)–semiconductor devices Fulltext Access 4 Pages 2007
Electrical characterization of metal-oxide-high-k dielectric-oxide-semiconductor (MOHOS) structures for memory applications Fulltext Access 4 Pages 2007
Fault localization at high voltage devices using thermally induced voltage alteration (TIVA) Fulltext Access 4 Pages 2007
Switching times variation of power MOSFET devices after electrical stress Fulltext Access 4 Pages 2007
Inkjettable conductive adhesive for use in microelectronics and microsystems technology Fulltext Access 4 Pages 2007
Micro-mechanical testing of SiLK by nanoindentation and substrate curvature techniques Fulltext Access 4 Pages 2007
Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping Fulltext Access 4 Pages 2007
Characterization and analysis of trap-related effects in AlGaN–GaN HEMTs Fulltext Access 4 Pages 2007
Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC Fulltext Access 4 Pages 2007
Ionising radiation and electrical stress on nanocrystal memory cell array Fulltext Access 4 Pages 2007
Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits Fulltext Access 4 Pages 2007
Investigation of low temperature SRAM and ROM failures to enable the replacement of cold test insertion by room temperature test Fulltext Access 4 Pages 2007
Importance of multi-temp testing in automotive qualification and zero defects program Fulltext Access 4 Pages 2007
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs Fulltext Access 4 Pages 2007
Photoluminescence studies from micropillars fabricated on IV–VI multiple quantum-well semiconductor structure Fulltext Access 4 Pages 2007
Correlation between infrared transmission spectra and the interface trap density of SiO2 films Fulltext Access 4 Pages 2007
Ferroelectric characteristic of group IV elements added SrBi2Ta2O9 thin films Fulltext Access 4 Pages 2007
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage Fulltext Access 4 Pages 2007
Carrier trapping in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices Fulltext Access 4 Pages 2007
Effects of precursor aging and post-deposition treatment time on photo-assisted sol–gel derived low-dielectric constant SiO2 thin film on Si Fulltext Access 4 Pages 2007
Characteristics of quadratic electro-optic effects and electro-absorption process in CdSe parabolic quantum dots Fulltext Access 4 Pages 2007
Challenges and performance limitations of high-k and oxynitride gate dielectrics for 90/65 nm CMOS technology Fulltext Access 4 Pages 2007
Effect of Si doping on the photoluminescence properties of AlGaInP/GaInP multiple quantum wells Fulltext Access 4 Pages 2007
Simulated analysis for InGaP/GaAs heterostructure-emitter bipolar transistor with InGaAs/GaAs superlattice-base structure Fulltext Access 4 Pages 2007
Highly efficient green top-emitting organic light-emitting devices with metal electrode structure Fulltext Access 4 Pages 2007
Rectification and NIR photoresponse in p-Si/phthalocyanine/metal heterostructures Fulltext Access 4 Pages 2007
Electrical characterization of solid-state heterojunctions between PEDOT:PSS and an anionic polyelectrolyte Fulltext Access 4 Pages 2007
The influence of nitrogen and fluorine on the dielectric constant of hydrogenated amorphous carbon (a-C:H) films Fulltext Access 4 Pages 2007
The electroluminescent investigation of double layer Eu-complex organic electronic luminescence diodes Fulltext Access 4 Pages 2007
Characteristics of high Al content AlxGa1−xN grown by metalorganic chemical vapor deposition Fulltext Access 4 Pages 2007
Fabrication and effect of the dielectric permittivity on the ideality factor of MEH-PPV Schottky diodes doped with electron acceptor fluorescent dyes Fulltext Access 4 Pages 2007
Determination of the frequency–amplitude relation for a Duffing-harmonic oscillator by the energy balance method Fulltext Access 4 Pages 2007
He’s homotopy perturbation method for a boundary layer equation in unbounded domain Fulltext Access 4 Pages 2007
Variational approach to solitary wave solution of the generalized Zakharov equation Fulltext Access 4 Pages 2007
Application of He’s semi-inverse method to the nonlinear Schrödinger equation Fulltext Access 4 Pages 2007
Reliability aspects of Hf-based capacitors: Breakdown and trapping effects Fulltext Access 4 Pages 2007
Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization Fulltext Access 4 Pages 2007
An investigation of surface state capture cross-sections for metal–oxide–semiconductor field-effect transistors using HfO2 gate dielectrics Fulltext Access 4 Pages 2007
Influence of the SiO2 layer thickness on the degradation of HfO2/SiO2 stacks subjected to static and dynamic stress conditions Fulltext Access 4 Pages 2007
Impact of Al-, Ni-, TiN-, and Mo-metal gates on MOCVD-grown HfO2 and ZrO2 high-κ dielectrics Fulltext Access 4 Pages 2007
Post deposition annealing studies of lanthanum aluminate and ceria high-k dielectrics on germanium Fulltext Access 4 Pages 2007
Electrical characterization of crystalline Gd2O3 gate dielectric MOSFETs fabricated by damascene metal gate technology Fulltext Access 4 Pages 2007
Optimization of HfSiON using a design of experiment (DOE) approach on 0.45 V Vt Ni-FUSI CMOS transistors Fulltext Access 4 Pages 2007
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks Fulltext Access 4 Pages 2007
Effects of post-thermal treatment on the properties of rf reactive sputtered ITO films Fulltext Access 4 Pages 2007
Fabrication of silicon field-emission arrays using masks of amorphous hydrogenated carbon films Fulltext Access 4 Pages 2007
High-mobility pentacene thin-film transistors with copolymer-gate dielectric Fulltext Access 4 Pages 2007
Microwave and hot filament chemical vapour deposition of diamond multilayers on Si and WC–Co substrates Fulltext Access 4 Pages 2007
Design and characterization of high-voltage NMOS and PMOS devices in standard 0.25 μm CMOS technology Fulltext Access 4 Pages 2007
Effects of bottom electrode and environmental insulator on thermal distribution of edge contact-type PRAM cell Fulltext Access 4 Pages 2007
Surface characterization of epitaxial lateral overgrowth of InP on InP/GaAs substrate by MOCVD Fulltext Access 4 Pages 2007
Simulation and analysis of metamorphic high electron mobility transistors Fulltext Access 4 Pages 2007