Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Non-centrosymmetric materials; GaP; Cartography;
مقالات ISI پراکندگی یون های متوسط انرژی (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Quantitative depth profiling; Nanolayer analysis; Energy loss to depth conversion; Screening and charge exchange corrections;
Keywords: پراکندگی یون های متوسط انرژی; AES; auger electron spectroscopy; AFM; atomic force microscopy; APDBs; antiphase domain boundaries; CEMS; conversion electron Mössbauer spectroscopy; CTR; crystal truncation rod; DBT; distorted bulk truncation; DFT; density functional theory; DFT+U; dens
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; RBS; Computer simulation
Optical and structural characterization of Ge clusters embedded in ZrO2
Keywords: پراکندگی یون های متوسط انرژی; Spectroscopic ellipsometry; Ge nanoclusters; ZrO2; RF magnetron sputtering; Medium energy ion scattering;
The influence of CO adsorption on the surface composition of cobalt/palladium alloys
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Vibrational spectroscopy; Alloy;
Adsorbate-induced surface stress, surface strain and surface reconstruction: CH3S on Cu(100) and Cu(111)
Keywords: پراکندگی یون های متوسط انرژی; Density functional theory; Medium energy ion scattering; Surface structure; Surface reconstruction; Copper; Methyl thiolate;
High-K materials and metal gates for CMOS applications
Keywords: پراکندگی یون های متوسط انرژی; ALD; atomic layer deposition; CB; conduction band; CBO; conduction band offset; CMOS; complimentary metal oxide semiconductor; CNL; charge neutrality level; CV; capacitance voltage; CVD; chemical vapour deposition; DB; dangling bond; DOS; density of state
Crystal orientation dependence of charge distributions of He ions scattered from rutile TiO2(1Â 1Â 0) surfaces
Keywords: پراکندگی یون های متوسط انرژی; He+ fractions; Medium energy ion scattering; Rutile TiO2(1Â 1Â 0) surface; Crystal orientation dependence;
MEIS, TEM and GISAXS investigation of buried Pb nanoislands in SiO2/Si interface
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Nanoparticles; Transmission electron microscopy; Grazing incidence small-angle X-ray scattering;
Alloy formation in the Co/Pd{111} system - A study with medium energy ion scattering and scanning tunnelling microscopy
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Palladium; Cobalt; Alloys; Surface segregation; Scanning tunnelling microscopy;
Enhanced and correlated lattice vibrations of relaxed Cu(0 0 1) surface studied by high-resolution medium energy ion scattering
Keywords: پراکندگی یون های متوسط انرژی; Enhanced and correlated lattice vibrations; Medium energy ion scattering; Relaxed Cu(0 0 1) surface; Molecular dynamics simulations; Monte Carlo simulations
Cross sections for medium energy He ions scattered from Hf and Au atoms
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Scattering cross section
Effect of nitrogen incorporation and oxygen vacancy on electronic structure and the absence of a gap state in HfSiO films
Keywords: پراکندگی یون های متوسط انرژی; HfSiO; Abâinitio calculations; Medium energy ion scattering; Near-edge x-ray absorption fine structure; Reflection electron energy loss spectroscopy; Absence of gap state;
Energy loss of protons in SrTiO3 studied by medium energy ion scattering
Keywords: پراکندگی یون های متوسط انرژی; Stopping power; Medium energy ion scattering; Strontium titanate; Interface;
Oxygen deficiency and excess of rutile titania (1Â 1Â 0) surfaces analyzed by ion scattering coupled with elastic recoil detection
Keywords: پراکندگی یون های متوسط انرژی; Oxygen vacancies; Oxygen adsorption; TiO2(1Â 1Â 0); Defect state; Medium energy ion scattering; Elastic recoil detection;
Au(core)/Pd(shell) structures analyzed by high-resolution medium energy ion scattering
Keywords: پراکندگی یون های متوسط انرژی; Nano-particles; Core/shell structure; Medium energy ion scattering
Behavior of strain at a thin Ge pile-up layer formed by dry oxidation of a Si0.7Ge0.3 film
Keywords: پراکندگی یون های متوسط انرژی; Si1 − xGex; Oxidation; Ge pile-up layer; Relaxation; Medium energy ion scattering; Strain
Graphene on SiC(0001) and SiC(0001Ì
) surfaces grown via Ni-silicidation reactions
Keywords: پراکندگی یون های متوسط انرژی; Graphene; Band dispersion; Work function; SiC(0001); SiC(0001Ì
); Medium energy ion scattering; Photoelectron spectroscopy;
Electronic charge transfer between Au nano-particles and TiO2-terminated SrTiO3(0Â 0Â 1) substrate
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Photoelectron spectroscopy; Catalysis; Surface electronic phenomena; Gold nano-particles; Strontium titanate;
Stacking faults in ultra-thin films of silver on Al(111) investigated by medium energy ion scattering
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Aluminium; Silver; Surface alloy; Ultra-thin film; Hexagonal close packing;
Ultra-thin films and surface alloying of Pd on Cu(1Â 1Â 1) investigated by medium energy ion scattering
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Palladium; Copper; Surface alloy; Ultra-thin film;
Charge exchange of medium energy H and He ions emerging from solid surfaces
Keywords: پراکندگی یون های متوسط انرژی; 68.49.Sf; 61.18.Bn; 79.20Charge exchange; Medium energy ion scattering; Solid surfaces
Final state effect for Au 4f line from gold-nano-particles grown on oxides and HOPG supports
Keywords: پراکندگی یون های متوسط انرژی; Au nano-particles; Final state effect; Au 4f line; Photoelectron spectroscopy; Medium energy ion scattering; Scanning electron microscope of a field-emission type;
Alloy formation in the Au{1 1 1}/Ni system - An investigation with scanning tunnelling microscopy and medium energy ion scattering
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Nickel; Gold; Alloys; Surface segregation; Scanning tunnelling microscopy;
Post deposition annealing of Hf aluminate films on Si investigated by ion backscattering and nuclear reaction analyses
Keywords: پراکندگی یون های متوسط انرژی; 85.50.−n; 68.55.−a; 82.80.−dHafnium compounds; Aluminium compounds; Atomic layer deposition; Dielectric thin films; Noncrystalline structure; Annealing; Interdiffusion; Atomic transport; Narrow nuclear reaction profiling; Medium energy ion scattering; Low
Structures of clean and oxygen-adsorbed SiC(0Â 0Â 0Â 1)-(3Â ÃÂ 3) surfaces
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Photoelectron spectroscopy; Surface chemical reaction; Silicon carbide; Surface structure;
The structure and growth process of Au/Si(1Â 1Â 1) analyzed by high-resolution ion scattering coupled with photoelectron spectroscopy
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Photoelectron spectroscopy; Surface chemical reaction; Surface structure; Gold; Silicides;
Methylthiolate-induced reconstruction of Ag(1 1 1): A medium energy ion scattering study
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Surface reconstruction; Surface structure; Chemisorption; Silver; Methanethiol;
Surface structure of sphalerite studied by medium energy ion scattering and XPS
Keywords: پراکندگی یون های متوسط انرژی; X-ray photoelectron spectroscopy; Medium energy ion scattering; Surface structure; Sphalerite; ZnS; Photoelectron emission; Wide bandgap semiconductor;
Atomic and electronic structures of 6H-SiC(0001¯)-3Ã3 surfaces
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Reflection high energy electron diffraction; Synchrotron-radiation photoelectron spectroscopy; Surface structure; Silicon carbide;
The growth of ultrathin Au films on Ni{1 1 1}: A study with medium energy ion scattering
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Catalysis; Nickel; Gold; Alloys; Surface segregation;
Solid-phase epitaxial regrowth of a shallow amorphised Si layer studied by X-ray and medium energy ion scattering
Keywords: پراکندگی یون های متوسط انرژی; Solid-phase epitaxial regrowth; Amorphised Si layer; Medium energy ion scattering; X-ray scattering;
Evidence of multiphase nucleation in perovskite film growth on MgO substrate from medium energy ion scattering analysis: Example of YBaCuO and (Ba,Sr)TiO3
Keywords: پراکندگی یون های متوسط انرژی; 61.85.+p.; 68.55.Ac; 74.78.Bz; 77.55.+f; 82.80.Yc; Medium energy ion scattering; Perovskites; Nucleation; Sputtering;
Initial growth processes of ultra-thin Ni-layers on Si(1Â 1Â 1) and electronic structure of epitaxially grown NiSi2
Keywords: پراکندگی یون های متوسط انرژی; Medium energy ion scattering; Photoelectron spectroscopy; Surface structure; Nickel; Silicides; Surface electronic phenomena;