Keywords: طیف سنجی برگشت رادرفورد; ZnO; Semiconductor; Thin film; X-ray diffraction; Rutherford backscattering spectroscopy; Auger electron spectroscopy;
مقالات ISI طیف سنجی برگشت رادرفورد (ترجمه نشده)
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Keywords: طیف سنجی برگشت رادرفورد; Boron; Oxidation; Thin films; Rutherford backscattering spectroscopy; AFM;
Keywords: طیف سنجی برگشت رادرفورد; Ripples; Silicon; Surface patterning; Irradiation; Rutherford backscattering spectroscopy;
Keywords: طیف سنجی برگشت رادرفورد; Helium ion microscopy; Ion scattering; Rutherford backscattering spectroscopy;
Keywords: طیف سنجی برگشت رادرفورد; Multilayer Ti/TiN/Ti coatings; Pulsed laser deposition; Light absorption and reflection; X-ray spectroscopies; Rutherford backscattering spectroscopy
Keywords: طیف سنجی برگشت رادرفورد; Rutherford backscattering spectroscopy; Raman spectroscopy; Graphite; Schottky contacts; High temperature operating; Ruthenium silicide;
Keywords: طیف سنجی برگشت رادرفورد; Titanium nitride; Hard coatings; Sputtering; Irradiation; Transmission electron microscopy; Rutherford backscattering spectroscopy; X-ray diffraction; Infrared spectroscopy;
Effects of thermal annealing on structural and magnetic properties of Mn ions implanted AlInN/GaN films
Keywords: طیف سنجی برگشت رادرفورد; Ion implantation; GaN; X-ray diffraction; Rutherford backscattering spectroscopy; Vibrating sample magnetometry; First principles calculations;
High resolution in situ Li depth profiling of thin films stacked Li ion batteries under charging conditions by means of TERD and RBS techniques with 5â¯MeV He+2 ion beam
Keywords: طیف سنجی برگشت رادرفورد; Li ion battery; Transmission elastic recoil detection analysis; Rutherford backscattering spectroscopy; Li depth profiling;
Anodic film growth and silver enrichment during anodizing of an Mg-0.6â¯at.% Ag alloy in fluoride-containing organic electrolytes
Keywords: طیف سنجی برگشت رادرفورد; Magnesium; Silver; Anodizing; Organic electrolyte; Rutherford backscattering spectroscopy;
Structural and optical investigations of 120â¯keV Ag ion implanted ZnO thin films
Keywords: طیف سنجی برگشت رادرفورد; Ion implantation; Rutherford backscattering spectroscopy; Raman spectroscopy; Zinc oxide; Thin films; Sputtering; X-ray diffraction;
Epitaxial BaxSr1 â xTiO3/YBa2Cu3O7 bilayers for tunable microwave applications
Keywords: طیف سنجی برگشت رادرفورد; Pulsed laser deposition; Microwave antennae; Superconduction; X-ray diffraction; Rutherford backscattering spectroscopy; Atomic force microscopy;
Simulation of RBS spectra with known 3D sample surface roughness
Keywords: طیف سنجی برگشت رادرفورد; Computer simulation; Rutherford Backscattering Spectroscopy; Surface roughness; AFM;
Influence of pre- and post-treatments on formation of a trivalent chromium conversion coating on AA2024 alloy
Keywords: طیف سنجی برگشت رادرفورد; Aluminium alloy; Trivalent chromium conversion coating; Corrosion protection; Transmission electron microscopy; Rutherford backscattering spectroscopy; X-ray photoelectron microscopy;
Colloidal synthesis of nanostructured pure ZnO and Cd doped ZnO thin films and their characterization
Keywords: طیف سنجی برگشت رادرفورد; ZnO; CdO; Thin film; X-ray diffraction; Rutherford backscattering spectroscopy
Structure and composition of Al(Si)CuFe approximant thin films formed by Si substrate diffusion
Keywords: طیف سنجی برگشت رادرفورد; Approximant; Al-Si-Cu-Fe; X-Ray Diffraction; Transmission Electron Microscopy; Rutherford Backscattering Spectroscopy; Time-of-Flight Energy Elastic Recoil Detection Analysis; Multilayer Thin Films; Magnetron Sputtering;
Composition of PbTe oxides obtained by different methods
Keywords: طیف سنجی برگشت رادرفورد; IV–VI semiconductor compounds; Oxide coating; Ternary lead–tellurium oxides; Pb2+ intracenter luminescence; TOF-SIMS; Rutherford backscattering spectroscopy
Superior electrochemical performance of mesoporous Fe3O4/CNT nanocomposites as anode material for lithium ion batteries
Keywords: طیف سنجی برگشت رادرفورد; Composite materials; Electrode materials; Chemical synthesis; Electrochemical reactions; Rutherford backscattering spectroscopy;
Structure, surface morphology and electrical properties of evaporated Ni thin films: Effect of substrates, thickness and Cu underlayer
Keywords: طیف سنجی برگشت رادرفورد; Nickel; Thin films; Evaporation; Copper; Rutherford Backscattering Spectroscopy; X-ray diffraction; Scanning Electron Microscope;
Analysis of depth redistribution of implanted Fe near SiO2/Si interface
Keywords: طیف سنجی برگشت رادرفورد; Ion implantation; Rutherford backscattering spectroscopy; Diffusion process; Cluster aggregation;
Annealing behavior of impurities and defects in keV Er-implanted ZnO bulk single crystals
Keywords: طیف سنجی برگشت رادرفورد; Ion implantation; Rutherford backscattering spectroscopy; ZnO
Influence of magnesium doping on the structural and optical properties of tin (II) oxide thin films deposited by electron beam evaporation
Keywords: طیف سنجی برگشت رادرفورد; Magnesium doping in Tin (II) oxide; Rutherford backscattering spectroscopy; Optical transmission; Band gap; Photoluminescence
Effects of low energy ion bombardment on the formation of cubic iron mononitride thin films
Keywords: طیف سنجی برگشت رادرفورد; Iron nitride; Dual ion beam sputtering; Rutherford backscattering spectroscopy; X-ray diffraction; Mössbauer spectroscopy
Influence of implantation parameters on the depth distribution of emitting Si-nc
Keywords: طیف سنجی برگشت رادرفورد; Si nanocrystals; Ion implantation; Luminescence; Light interference; Ellipsometry; Rutherford backscattering spectroscopy
Copper diffusion in thin In2S3 layers investigated by Rutherford Backscattering Spectroscopy
Keywords: طیف سنجی برگشت رادرفورد; Diffusion; Rutherford Backscattering Spectroscopy; Indium sulphide; Etching; Copper thiocyanate; CuSCN
Preparation of single-crystal TiC (111) by radio frequency magnetron sputtering at low temperature
Keywords: طیف سنجی برگشت رادرفورد; Titanium carbide; Radio-frequency magnetron sputtering; Rutherford backscattering spectroscopy; X-ray diffraction
On the zinc nitride properties and the unintentional incorporation of oxygen
Keywords: طیف سنجی برگشت رادرفورد; Zinc nitride; Radio-frequency magnetron sputtering; Rutherford backscattering spectroscopy; X-ray diffraction; Hall effect measurements; Oxygen; Contamination
Oxidation states of molybdenum in oxide films formed in sulphuric acid and sodium hydroxide
Keywords: طیف سنجی برگشت رادرفورد; Molybdenum; Oxides; Oxidation state; Sulphuric acid; Sodium hydroxide; X-ray photoelectron spectroscopy; Rutherford backscattering spectroscopy; Nuclear reaction analysis;
Enhancement of photoluminescence in Er-doped Ag–SiO2 nanocomposite thin films: A post annealing study
Keywords: طیف سنجی برگشت رادرفورد; Photoluminescence; Rutherford backscattering spectroscopy; Secondary ion mass spectroscopy
Structure and AC conductivity of nanocrystalline Yttrium oxide thin films
Keywords: طیف سنجی برگشت رادرفورد; Yttrium oxide; Thin films; Crystal structure; Structural transformations; Composition; Rutherford backscattering spectroscopy; Electronic transport; Relaxation
Correlation between resistivity and oxygen vacancy of hydrogen-doped indium tin oxide thin films
Keywords: طیف سنجی برگشت رادرفورد; Interstitial hydrogen; Oxygen vacancy; Indium tin oxide thin films; X-ray photoelectron spectroscopy; Rutherford backscattering spectroscopy
Engineering of hydrophilic and plasmonic properties of Ag thin film by atom beam irradiation
Keywords: طیف سنجی برگشت رادرفورد; Hydrophilic property; Surface plasmon resonance; Power spectral density; Contact angle; Rutherford backscattering spectroscopy;
Magnetism in GaN layers implanted by La, Gd, Dy and Lu
Keywords: طیف سنجی برگشت رادرفورد; Magnetic semiconductors; III–V semiconductors; Ion implantation; Rare earth; X-ray diffraction; Rutherford backscattering spectroscopy; Secondary ion mass spectrometry; Magnetic properties of thin films
The properties of radio frequency sputtered transparent and conducting ZnO:F films on polyethylene naphthalate substrate
Keywords: طیف سنجی برگشت رادرفورد; Rutherford Backscattering Spectroscopy; Polyethylene naphthalate; Flexible electronics; Thin films; Zinc Oxide; Sputtering; ZnO:F; Transparent conducting oxide; Electrical properties and measurements; Optical properties;
Effect of deposition temperature on the properties of sputtered YIG films grown on quartz
Keywords: طیف سنجی برگشت رادرفورد; Rutherford backscattering spectroscopy; Grazing incidence X-ray diffraction; Sputtering; Magnetic materials
Damage evolution in Au-implanted Ho2Ti2O7 titanate pyrochlore
Keywords: طیف سنجی برگشت رادرفورد; Damage accumulation; Amorphization; Holmium titanate pyrochlore; Irradiation; Rutherford backscattering spectroscopy
Physico-chemical, structural and physical properties of hydrogenated silicon oxinitride films elaborated by pulsed radiofrequency discharge
Keywords: طیف سنجی برگشت رادرفورد; Hydrogenated silicon oxynitride; Pulsed plasma enhanced chemical vapor; Silicon nanocrystals; Infrared spectroscopy; Rutherford backscattering spectroscopy; Raman spectroscopy; Transmission electron microscopy; Spectroscopic ellipsometry
Formation of As enriched layer by steam oxidation of As+-implanted Si
Keywords: طیف سنجی برگشت رادرفورد; 61.72.uf (silicon, doping and ion implantation); Thermal oxidation; Rutherford Backscattering Spectroscopy; Ion implantation; Shallow junction; As impurity;
ZnTe/Si heterostructures grown by isothermal closed space sublimation
Keywords: طیف سنجی برگشت رادرفورد; 81.05.Dz; 68.43.Mn; 68.55.Jk; 81.15.KkZinc telluride; II–VI semiconductors; Vapour phase epitaxy; Closed space sublimation; X-ray diffraction; Rutherford backscattering spectroscopy
Hydrogen desorption from a diamond-like carbon film by hyperthermal atomic oxygen exposure
Keywords: طیف سنجی برگشت رادرفورد; 68.55.am; 68.49.DF; 61.05.Np; 37.20.+j; Atomic oxygen; Diamond-like carbon; Hydrogen; Rutherford backscattering spectroscopy; Elastic recoil detection analysis; Synchrotron radiation;
Thermoelectric properties of MeV Si ion bombarded Bi2Te3/Sb2Te3 superlattice deposited by magnetron sputtering
Keywords: طیف سنجی برگشت رادرفورد; Themoelectric multilayer superlattice; Ion bombardment; Rutherford backscattering spectroscopy; 3ω measurement of thin film thermal conductivity
Theoretical analysis of mass and depth resolutions of cyclotron Rutherford backscattering spectrometry system
Keywords: طیف سنجی برگشت رادرفورد; 29.30.EpSpectrometer; Rutherford backscattering spectroscopy; Cyclotron trajectory; Mass resolution; Depth resolution
Chromium oxide-based multilayer coatings deposited by reactive magnetron sputtering in an industrial setup
Keywords: طیف سنجی برگشت رادرفورد; X-ray diffraction (XRD); Scanning electron microscopy (SEM); Rutherford backscattering spectroscopy; Reactive sputtering; Chromium oxide; Multilayer;
Improvement on thermoelectric properties of multilayered Si1−xGex/Si by ion beam bombardment
Keywords: طیف سنجی برگشت رادرفورد; 81.07.−bThermoelectric multilayer superlattice; Ion bombardment; Rutherford backscattering spectroscopy; 3ω measurement of thin film thermal conductivity
Growth and structure of epitaxial CeO2 films on yttria-stabilized ZrO2
Keywords: طیف سنجی برگشت رادرفورد; Cerium oxide; Zirconium oxide; Epitaxy; Surface morphology; Surface structure; Transmission electron microscopy; Rutherford backscattering spectroscopy; Low energy electron diffraction
Tribo-mechanical properties of thin boron coatings deposited on polished cobalt alloy surfaces for orthopedic applications
Keywords: طیف سنجی برگشت رادرفورد; Boron; Amorphous materials; Coatings; Biomaterials; Deposition process; Rutherford backscattering spectroscopy; Tribology; Cobalt alloy;
Effect of oblique-angle deposition on early stage of Fe–Si growth
Keywords: طیف سنجی برگشت رادرفورد; Iron silicide; Oblique-angle deposition; Rutherford backscattering spectroscopy; Ion channeling
Subsurface structures in initial stage of FeSi2 growth studied by high-resolution Rutherford backscattering spectroscopy
Keywords: طیف سنجی برگشت رادرفورد; Iron silicide; Reactive deposition epitaxy; Rutherford backscattering spectroscopy; Ion channeling
Atomic layer deposition of PbZrO3 thin films
Keywords: طیف سنجی برگشت رادرفورد; 68.37.Ps; 68.55.Jk; 68.55.Nq; 81.15.âz; 81.15.Gh; 82.80.Yc; Atomic layer deposition; ALD; Lead zirconate; X-ray diffraction; Atomic force microscopy; Rutherford backscattering spectroscopy;
Diffusion during annealing of Al/Cu/Fe thin films
Keywords: طیف سنجی برگشت رادرفورد; Diffusion; Rutherford backscattering spectroscopy; Auger electron spectroscopy; Al–Cu–Fe