Keywords: بیضه سنجی طیف سنجی; Swift iron ion; GaSb; Spectroscopic ellipsometry; AFM; UV-VIS-NIR;
مقالات ISI بیضه سنجی طیف سنجی (ترجمه نشده)
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Keywords: بیضه سنجی طیف سنجی; Data analysis; Model selection; Parameterization; Information criteria; Spectroscopic ellipsometry; Optical characterization; Multilayered structures; Optical metrology
Keywords: بیضه سنجی طیف سنجی; Laser processing; Raman spectroscopy; Spectroscopic ellipsometry; Glassy carbon;
Keywords: بیضه سنجی طیف سنجی; Multilayered structures; Optical characterization; Thin-film thickness measurements; Sensitivity analysis; Spectroscopic ellipsometry; Semiconductor manufacturing
Keywords: بیضه سنجی طیف سنجی; InGaZnO; Spectroscopic ellipsometry; Dielectric function; Process deposition; Amorphous semiconductor;
Keywords: بیضه سنجی طیف سنجی; Atomic layer deposition; Spectroscopic ellipsometry; Quantum confinement effects; Nucleation density;
Keywords: بیضه سنجی طیف سنجی; Microwave plasma chemical vapour deposition; Boron-doped diamond films; Optical constants; Spectroscopic ellipsometry; Cyclic voltammetry
Keywords: بیضه سنجی طیف سنجی; Gold; Nanoparticles; Metal islands; Localized surface plasmons; Spectroscopic ellipsometry; GISAXS; Optical properties; Structural properties;
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Resistance switching; Manganite; PCMO; RF magnetron sputtering;
Keywords: بیضه سنجی طیف سنجی; ZnO thin film; Spectroscopic ellipsometry; Dielectric function;
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; In vitro characterization; Optical property of cell; Incoherent layers; Scattering at cell surface;
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Lanthanum aluminate; Lattice dynamics; Infrared; Dielectric function;
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Depth profile; Nanocrystal;
Keywords: بیضه سنجی طیف سنجی; NiO nanocrystalline; Thin film; XRD; SEM; Spectroscopic ellipsometry
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Ion-implantation; Annealing; Cavity; Depth profile;
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Zinc oxide; Amorphous silicon; Bismuth stannate; Bismuth germanate;
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Dielectric function; Nanocrystalline semiconductors; Parameterization
Keywords: بیضه سنجی طیف سنجی; Burstein–Moss effect; Free-carrier absorption; Spectroscopic ellipsometry; Heterojunction solar cells
Keywords: بیضه سنجی طیف سنجی; a-Si:H; Hydrogenated Amorphous Silicon; ALD; Atomic Layer Deposition; BSF; Back Surface Field; c-Si; Crystalline Silicon; HIT; Heterojunction with Intrinsic Thin layer; ICP-CVD; Inductively-Coupled Plasma Chemical Vapor Deposition; PVD; Physical Vapor Dep
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Optical characterization; Thin films; Optical properties; Thickness measurement; Correlation; Uniqueness; Semiconductor manufacturing;
Keywords: بیضه سنجی طیف سنجی; Coloured collectors; Solar coating; Thin-film filters; Reactive magnetron sputtering; Spectroscopic ellipsometry; Spectrophotometry; Solar transmittance; Photoelectron spectroscopy; Façade integration
Keywords: بیضه سنجی طیف سنجی; Organic solar cells; Spectroscopic Ellipsometry; Vertical phase separation; Optical properties; Morphology; Organic electronics
Keywords: بیضه سنجی طیف سنجی; Nanocrystalline diamond; Thin films; Microwave plasma-enhanced chemical vapor deposition; Pulsed plasma; Low deposition temperature; Spectroscopic ellipsometry; Raman spectroscopy
Keywords: بیضه سنجی طیف سنجی; Zwitterionic polymer; Polymer swelling; Cation; Anion; Spectroscopic ellipsometry
Keywords: بیضه سنجی طیف سنجی; Magnesium films; Magnetron sputtering; Optical constants; Spectroscopic ellipsometry; Plasmonics; Film texture;
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Finite-difference time-domain; Nanophotonics; Plasmonics; Optical critical dimension;
Keywords: بیضه سنجی طیف سنجی; ITO nanoparticles; Sol-gel method; Spin-coating; Morphology; Spectroscopic ellipsometry;
Keywords: بیضه سنجی طیف سنجی; 81.65.âb (81.65.Mq); 42.62.Cf; 42.55.Wd; 07.60.Dq; 07.60.Fs; 78.20.Ci; 82.80.Pv; Laser color marking; Titanium; Titanium oxides; Colorimetry; CIE L*a*b*; Color; Fiber laser; Dielectric function; Spectroscopic ellipsometry;
Keywords: بیضه سنجی طیف سنجی; Plasma-immersion implantation; Oxidation of H+ ion implanted Si; Spectroscopic ellipsometry;
Keywords: بیضه سنجی طیف سنجی; Optical properties; Conductivity; Surface morphology; Conducting polymers; Spectroscopic ellipsometry; Organic electronics;
Keywords: بیضه سنجی طیف سنجی; Nanocrystalline diamond; Microwave plasma enhanced CVD; Spectroscopic ellipsometry; Optical modeling;
Keywords: بیضه سنجی طیف سنجی; Titanium nitride; Resistivity; Spectroscopic ellipsometry; Current-voltage characteristics;
Keywords: بیضه سنجی طیف سنجی; Roll-to-roll gravure; Flexible organic photovoltaics; Spectroscopic ellipsometry; Phase separation; Roll-to-roll drying; Printed P3HT:PCBM;
Keywords: بیضه سنجی طیف سنجی; Drug delivery; Spectroscopic ellipsometry; Biodegradable polymers; Protein adsorption; Atomic force microscopy;
Keywords: بیضه سنجی طیف سنجی; Initiated chemical vapor deposition; Spectroscopic ellipsometry; Glass transition temperature; Thermal degradation; Gel-permeation chromatography;
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Thin film properties; Rough surfaces; Silicon nitride; Antireflection coating; Depolarization;
Keywords: بیضه سنجی طیف سنجی; CA; chronoamperometry; CV; cyclic voltammetry; OCP; open circuit potential; PCSA; Polariser-Compensator-Sample-Analyser; SE; spectroscopic ellipsometry; SHE; standard hydrogen electrode; Ellipsometric perturbation analysis; Aqueous corrosion; Passivity; Z
Keywords: بیضه سنجی طیف سنجی; Swift iron ions; Silicon; Spectroscopic ellipsometry; Optical depth profile
Dispersion properties in the visible range of carrier concentration of topologically protected Bi1-xSex films revealed by spectroscopic ellipsometry
Keywords: بیضه سنجی طیف سنجی; Topological insulator; Bismuth selenide; Spectroscopic ellipsometry; Optical property;
Optical planar waveguides based on tungsten-tellurite glass fabricated by rf-sputtering
Keywords: بیضه سنجی طیف سنجی; Planar optical waveguides; Radio Frequency Magnetron Sputtering; Tungsten-tellurite glasses doped with Er and Yb ions; Spectroscopic ellipsometry; Optical signal enhancement;
Optical properties of TiO2 thin films with crystal structure
Keywords: بیضه سنجی طیف سنجی; TiO2; Anatase; Rutile; Spectroscopic ellipsometry; Optical band gap;
Formamidinium + cesium lead triiodide perovskites: Discrepancies between thin film optical absorption and solar cell efficiency
Keywords: بیضه سنجی طیف سنجی; Formamidinium + cesium perovskite thin films; Optical properties; Spectroscopic ellipsometry; Defects concentration; EQE simulation;
Weakening of excitonic screening effects in TixZn1-xO thin films
Keywords: بیضه سنجی طیف سنجی; Doped zinc oxide; Titanium; Doping, thin film; Sputtering; Spectroscopic ellipsometry; Screening effects;
Impedance spectroscopy study of SrTiO3 pulse laser deposited photoelectrodes
Keywords: بیضه سنجی طیف سنجی; Strontium titanate; Photoelectrochemical cells; Electrochemical impedance spectroscopy; Spectroscopic ellipsometry; Pulsed laser deposition;
Temperature dependence of the optical properties of thin Ge-Se-In films
Keywords: بیضه سنجی طیف سنجی; Chalcogenide glasses; Glass structure; Spectroscopic ellipsometry; Optical properties; Linear coefficient of thermal expansion;
Structural and optical properties of optimized amorphous GeTe films for memory applications
Keywords: بیضه سنجی طیف سنجی; Phase change materials; Amorphous GeTe; Spectroscopic ellipsometry; XRD; XRR;
Phase transition analysis of thermochromic VO2 thin films by temperature-dependent Raman scattering and ellipsometry
Keywords: بیضه سنجی طیف سنجی; Vanadium dioxide; Phase transition; Raman spectroscopy; Spectroscopic ellipsometry; Temperature-dependent;
Photoluminescence in pulsed-laser deposited GeGaSbS:Er films
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Photoluminescence; Upconversion photoluminescence; Chalcogenide glasses; Pulsed-laser deposition; Raman scattering;
Optical properties of amorphous SiO2-TiO2 multi-nanolayered coatings for 1064-nm mirror technology
Keywords: بیضه سنجی طیف سنجی; Spectroscopic ellipsometry; Coatings; Multilayer; SiO2 thin film; TiO2 thin film;
Design and characterization of solar absorbing multilayer stack based on Al/ Cr-N-O / SiO2 layers
Keywords: بیضه سنجی طیف سنجی; Chromium oxynitride; Solar selective absorbing coating; Spectroscopic ellipsometry; Dielectric function modeling;