
Structural analysis of the c(4 Ã 2) reconstruction in Si(0 0 1) and Ge(0 0 1) surfaces by low-energy electron diffraction
Keywords: توپولوژی; Si(0Â 0Â 1); Ge(0Â 0Â 1); Low-energy electron diffraction (LEED); Surface structure; Morphology; Roughness; Topology;