Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach Fulltext Access 6 Pages 2005
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability Fulltext Access 6 Pages 2005
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue Fulltext Access 6 Pages 2005
Assessment of the Trench IGBT reliability: low temperature experimental characterization Fulltext Access 6 Pages 2005
Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles Fulltext Access 6 Pages 2005
Automated setup for thermal imaging and electrical degradation study of power DMOS devices Fulltext Access 6 Pages 2005
Moisture diffusion in Printed Circuit Boards: Measurements and Finite- Element- Simulations Fulltext Access 6 Pages 2005
Correlation between Experimental Results and FE Simulations to Evaluate Lead-Free BGA Assembly Reliability Fulltext Access 6 Pages 2005
Isolating failing sites in IC packages using time domain reflectometry: Case studies Fulltext Access 6 Pages 2005
Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions Fulltext Access 6 Pages 2005
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations Fulltext Access 6 Pages 2005
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices Fulltext Access 6 Pages 2005
Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products Fulltext Access 6 Pages 2005
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast Fulltext Access 6 Pages 2005
Innovative packaging technique for backside optical testing of wire-bonded chips Fulltext Access 6 Pages 2005
Parallel computing for globally optimal decision making on cluster systems Fulltext Access 6 Pages 2005
Improving the yield and reliability of the bulk-silicon HV-CMOS by adding a P-well Fulltext Access 6 Pages 2005
Determination of the dice forward I-V characteristics of a power diode from a packaged device and its applications Fulltext Access 6 Pages 2005
Nanoscale structural characteristics and electron field emission properties of transition metal-fullerene compound TiC60 films Fulltext Access 6 Pages 2005
Unification of digital evidence from disparate sources (Digital Evidence Bags) Fulltext Access 6 Pages 2005
Development of efficient computational kernels and linear algebra routines for out-of-order superscalar processors Fulltext Access 6 Pages 2005
A cost-optimal parallel implementation of a tridiagonal system solver using skeletons Fulltext Access 6 Pages 2005
DRAxML@home: a distributed program for computation of large phylogenetic trees Fulltext Access 6 Pages 2005
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout Fulltext Access 6 Pages 2005
Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance Fulltext Access 6 Pages 2005
Implementation, analysis and performance evaluation of the IRP replacement policy Fulltext Access 6 Pages 2005
Monolithic active pixel sensor realized in SOI technology-concept and verification Fulltext Access 6 Pages 2005
Lateral punch-through TVS devices for on-chip protection in low-voltage applications Fulltext Access 6 Pages 2005
Effect of localized traps on the anomalous behavior of the transconductance in nanocrystalline TFTs Fulltext Access 6 Pages 2005
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect Fulltext Access 6 Pages 2005
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime Fulltext Access 6 Pages 2005
Effect of substrate metallization on mechanical properties of Sn-3.5Ag BGA solder joints with multiple reflows Fulltext Access 6 Pages 2005
Wide band frequency and in situ characterization of high permittivity insulators (high-k) for high-speed integrated passives Fulltext Access 6 Pages 2005
Fabrication and characterization of buried silicide layers on SOI substrates for BICMOS-applications Fulltext Access 6 Pages 2005
Study of plasma mechanisms of hybrid a-SiOC:H low-k film deposition from decamethylcyclopentasiloxane and cyclohexene oxide Fulltext Access 6 Pages 2005
Scaling down thickness of ULK materials for 65Â nm node and below and its effect on electrical performance Fulltext Access 6 Pages 2005
The current limits of the laser-acoustic test method to characterize low-k films Fulltext Access 6 Pages 2005
Influence of the sidewall diffusion barrier on the transport properties of advanced Cu/low-k interconnects Fulltext Access 6 Pages 2005
Evaluation of lead-free SnAg solder ball deposition and reflow processes for flip chip applications Fulltext Access 6 Pages 2005
Potential of air gap technology by selective ozone/TEOS deposition: Effects of air gap geometry on the dielectric constant Fulltext Access 6 Pages 2005
Investigation of a Ta-Si-O/Ta-Si-N bilayer system for embedded SAW finger structures Fulltext Access 6 Pages 2005
Electrical and morphological change of Ag-Ni films by annealing in vacuum Fulltext Access 6 Pages 2005
Investigations of titanium nitride as metal gate material, elaborated by metal organic atomic layer deposition using TDMAT and NH3 Fulltext Access 6 Pages 2005
Atomic vapor deposition of Ru and RuO2 thin film layers for electrode applications Fulltext Access 6 Pages 2005
Gate stress effect on low temperature data retention characteristics of split-gate flash memories Fulltext Access 6 Pages 2005
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis Fulltext Access 6 Pages 2005
Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects Fulltext Access 6 Pages 2005
Effect of test condition and stress free temperature on the electromigration failure of Cu dual damascene submicron interconnect line-via test structures Fulltext Access 6 Pages 2005
ESD circuit model based protection network optimisation for extended-voltage NMOS drivers Fulltext Access 6 Pages 2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure Fulltext Access 6 Pages 2005
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs Fulltext Access 6 Pages 2005
Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs Fulltext Access 6 Pages 2005
Hot-carrier reliability of 20V MOS transistors in 0.13 μm CMOS technology Fulltext Access 6 Pages 2005
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs Fulltext Access 6 Pages 2005
Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials Fulltext Access 6 Pages 2005
Investigation on seal-ring rules for IC product reliability in 0.25-μm CMOS technology Fulltext Access 6 Pages 2005
Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models Fulltext Access 6 Pages 2005
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability Fulltext Access 6 Pages 2005
Effects of conditioning temperature on polishing pad for oxide chemical mechanical polishing process Fulltext Access 6 Pages 2005
Characterization of atomic layer deposited nanoscale structure on dense dielectric substrates by X-ray reflectivity Fulltext Access 6 Pages 2005
The effect of tungsten and boron on the Cu barrier and oxidation properties of thin electroless cobalt-tungsten-boron films Fulltext Access 6 Pages 2005
Investigation of high performance Ta-Si-N/Cu/Ta-Si-N metallization system for SAW devices Fulltext Access 6 Pages 2005