Influence of oxide breakdown position and device aspect ratio on MOSFET's output characteristics Fulltext Access 4 Pages 2005
Optimization of low temperature silicon nitride processes for improvement of device performance Fulltext Access 4 Pages 2005
In situ steam generation (ISSG) versus standard steam technology: impact on oxide reliability Fulltext Access 4 Pages 2005
Silicon dioxide deposited by ECR-PECVD for low-temperature Si devices processing Fulltext Access 4 Pages 2005
Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides Fulltext Access 4 Pages 2005
Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy Fulltext Access 4 Pages 2005
Comparison of interfaces states density through their energy distribution and LVSILC induced by uniform and localized injections in 2.3Â nm thick oxides Fulltext Access 4 Pages 2005
Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric Fulltext Access 4 Pages 2005
Charge storage peculiarities in poly-Si-SiO2-Si memory devices with Si nanocrystals rich SiO2 Fulltext Access 4 Pages 2005
Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown Fulltext Access 4 Pages 2005
Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra Fulltext Access 4 Pages 2005
Admittance spectroscopy of traps at the interfaces of (1Â 0Â 0)Si with Al2O3, ZrO2, and HfO2 Fulltext Access 4 Pages 2005
Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor Fulltext Access 4 Pages 2005
On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers Fulltext Access 4 Pages 2005
Breakdown spots of ultra-thin (EOTÂ <Â 1.5Â nm) HfO2/SiO2 stacks observed with enhanced-CAFM Fulltext Access 4 Pages 2005
Reliability screening through electrical testing for press-fit alternator power diode in automotive application Fulltext Access 5 Pages 2005
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation Fulltext Access 5 Pages 2005
Rapid prototyping of two-dimensional photonic crystal devices by a dual beam focused ion beam system Fulltext Access 5 Pages 2005
A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications Fulltext Access 5 Pages 2005
Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning Fulltext Access 5 Pages 2005
Advanced electrical analysis of embedded memory cells using atomic force probing Fulltext Access 5 Pages 2005
Photon emission microscopy of inter/intra chip device performance variations Fulltext Access 5 Pages 2005
Degradation of high-K LA2O3 gate dielectrics using progressive electrical stress Fulltext Access 5 Pages 2005
Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics Fulltext Access 5 Pages 2005
Hydrogen-related influence of the metallization stack on characteristics and reliability of a trench gate oxide Fulltext Access 5 Pages 2005
Micromachining of organic polymers by X-ray photo-etching using a 10Â Hz laser-plasma radiation source Fulltext Access 5 Pages 2005
High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts Fulltext Access 5 Pages 2005
Study on the RF Sputtered hydrogenated amorphous silicon-germanium thin films Fulltext Access 5 Pages 2005
Probing stress effects in HfO2 gate stacks with time dependent measurements Fulltext Access 5 Pages 2005
Investigation into the correct statistical distribution for oxide breakdown over oxide thickness range Fulltext Access 5 Pages 2005
Implementation of high-k and metal gate materials for the 45Â nm node and beyond: gate patterning development Fulltext Access 5 Pages 2005
Improving reliability of beveled power semiconductor devices passivated by SIPOS Fulltext Access 5 Pages 2005
Evaluation of parasitic capacitances for interconnection buses crossing in different layers Fulltext Access 5 Pages 2005
Supporting the application of Situated Cellular Agents in non-uniform spaces Fulltext Access 5 Pages 2005
Percolative approach for failure time prediction of thin film interconnects under high current stress Fulltext Access 5 Pages 2005
Positive charge generation due to species of hydrogen during NBTI phenomenon in pMOSFETs with ultra-thin SiON gate dielectrics Fulltext Access 5 Pages 2005
Qualitative and quantitative analysis of acoustomigration effects in SAW-devices Fulltext Access 5 Pages 2005
Influence of injection level of charge carriers in nanostructured porous silicon on electroluminescence quantum efficiency Fulltext Access 5 Pages 2005
Terahertz radiation from narrow-gap semiconductors photoexcited by femtosecond laser pulses Fulltext Access 5 Pages 2005
Study of the impact of winding form and film thickness on thin-film inductors Fulltext Access 5 Pages 2005
Electrical characteristics of GaN-based metal-oxide-semiconductor (MOS) structures Fulltext Access 5 Pages 2005
Reservoir effect on electromigration mechanisms in dual-damascene Cu interconnect structures Fulltext Access 5 Pages 2005
Modeling of residual stresses in thin films deposited by electron beam evaporation Fulltext Access 5 Pages 2005
Correlation of electromigration defects in small damascene Cu interconnects with their microstructure Fulltext Access 5 Pages 2005
The effect of precursor system on the resistivity and oxidation susceptibility of C/SiC nanocomposites en route to electronic grade nanomaterials Fulltext Access 5 Pages 2005
Electron back scattered diffraction study of acoustomigration damage in Al/Ti metallization for SAW devices Fulltext Access 5 Pages 2005
TaN/Ta bilayer barrier characteristics and integration for 90 and 65Â nm nodes Fulltext Access 5 Pages 2005
Investigation of Ni/Co bilayer salicidation process for sub-40Â nm gate technology Fulltext Access 5 Pages 2005
Impact of dielectric stack and interface adhesion on mechanical properties of porous ultra low-k Fulltext Access 5 Pages 2005
Lateral solvent diffusion characterization of low k dielectric plasma damage and ALD barrier film closure Fulltext Access 5 Pages 2005
Silver metal organic chemical vapor deposition for advanced silver metallization Fulltext Access 5 Pages 2005
A systematic study of dry etch process for profile control of silicon tips Fulltext Access 5 Pages 2005
Nanoscaled niobium trilayer technology, using temperature controlled pattern transfer Fulltext Access 5 Pages 2005
Improvement in the aspect ratio of fabricated minute dots by the volume change thermal lithography technique Fulltext Access 5 Pages 2005
Fabrication of subwavelength aluminum wire grating using nanoimprint lithography and reactive ion etching Fulltext Access 5 Pages 2005
Utilizing self-assembled multilayers in lithographic processing for nanostructure fabrication: Initial evaluation of the electrical integrity of nanogaps Fulltext Access 5 Pages 2005
A hybrid CMOS-SET co-fabrication platform using nano-grain polysilicon wires Fulltext Access 5 Pages 2005
Fabrication of ultra-thin-film SOI transistors using the recessed channel concept Fulltext Access 5 Pages 2005
Novel resonant cantilever mass change detection and resonant frequency tuning Fulltext Access 5 Pages 2005
Fabrication error model and near field beam modulation analysis for phase step diffractive gratings Fulltext Access 5 Pages 2005
New method to correct eddy current in magnetic focusing-deflection system Fulltext Access 5 Pages 2005
Focused ion beam lithography for two dimensional array structures for photonic applications Fulltext Access 5 Pages 2005
Spin injection in double magnetic tunnel junctions: A tight-binding study Fulltext Access 5 Pages 2005
Modeling of a EEPROM device based on silicon quantum dots embedded in high-k dielectrics Fulltext Access 5 Pages 2005
Ab initio modeling of copper adhesion on regular BaTiO3(0Â 0Â 1) surfaces Fulltext Access 5 Pages 2005
Inter-granular magneto-resistance of a Fe3O4/CrO2 system with inversely polarized conduction electrons Fulltext Access 5 Pages 2005