Keywords: تنوع فرآیند; Design for testability; Hardware Trojans; Inherent vulnerabilities; Ring oscillator; Process variation;
مقالات ISI تنوع فرآیند (ترجمه نشده)
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Keywords: تنوع فرآیند; NoC; Process variation; Throughput; Asynchronous router; Synchronous router; Clock skew; Architecture level simulator;
Keywords: تنوع فرآیند; Standard cells; Leakage power; Process variation; Support Vector Machine; Probability density function;
Keywords: تنوع فرآیند; Memristor-based memory; Process variation; Statistical yield improvement; Multi-valued memory
Keywords: تنوع فرآیند; Asynchronous circuits; Statistical analysis; Process variation; Delay and power distribution; Petri Net
Keywords: تنوع فرآیند; Reliability; Small-delay defects; Process variation; Inter-path correlation; Delay testing
Keywords: تنوع فرآیند; Printed Electronics; Organic Electronics; Model; Process variation; Fully-Additive;
Keywords: تنوع فرآیند; Sheet metal forming; Finite element simulations; Robust optimization; Process variation; Material scatter;
Keywords: تنوع فرآیند; Process variation; Network on Chip; Interconnect; Clock skew; NoC topologies; Synchronous design; Asynchronous design
Keywords: تنوع فرآیند; Hard-error reliability; Modeling; Process variation
Keywords: تنوع فرآیند; Soft-edge flip-flop; Pipelined circuits design; Near-threshold computing; Process variation
On-chip self-calibration system for CMOS active inductor band pass filter
Keywords: تنوع فرآیند; Gyrator-C network; Active inductor; Band pass filter; Process variation; Self-calibration;
Analysis of electrical characteristics and proposal of design guide for ultra-scaled nanoplate vertical FET and 6T-SRAM
Keywords: تنوع فرآیند; RC delay; Nanoplate; Vertical FET; Channel pitch; SRAM; Read static noise margin; Process variation;
Static noise margin trade-offs for 6T-SRAM cell sizing in 28â¯nm UTBB FD-SOI CMOS technology
Keywords: تنوع فرآیند; CMOS memory circuits; Low voltage; Process variation; SRAM; Static noise margin; Sub-threshold operation; Yield;
Statistical estimation of delay in nano-scale CMOS circuits using Burr Distribution
Keywords: تنوع فرآیند; Delay distribution; Process variation; Statistical estimation; Nano-scaled circuits;
A high stable 8T-SRAM with bit interleaving capability for minimization of soft error rate
Keywords: تنوع فرآیند; Bit-interleaving; Half-selected disturbance; Stability; Leakage current; Process variation;
A high performance dual clock elastic FIFO network interface for GALS NoC
Keywords: تنوع فرآیند; Dual clock FIFO; GALS NoC interface; Performance evaluation; Process variation;
Transition metal dichalcogenide MoS2 field-effect transistors for analog circuits: A simulation study
Keywords: تنوع فرآیند; Transition metal dichalcogenide; Molybdenum disulfide; Fundamental metrics; Analog circuits; Process variation;
A read disturbance free differential read SRAM cell for low power and reliable cache in embedded processor
Keywords: تنوع فرآیند; SRAM; Short circuit current; Stability; Differential read; Process variation;
RF stability performance of SOI junctionless FinFET and impact of process variation
Keywords: تنوع فرآیند; Junctionless transistor; Process variation; Stability factor; Cut-off frequency; Maximum oscillation frequency;
An efficient trade-off between yield and energy for eDRAM caches under process variations
Keywords: تنوع فرآیند; Embedded dynamic random access memory; Process variation; Refresh; Yield; Energy-efficiency;
A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28Â nm FDSOI
Keywords: تنوع فرآیند; Process variation; Variability analysis; Magnetic flip-flop; Asymmetrical forward body bias; FDSOI;
High performance of junctionless MOSFET with asymmetric gate
Keywords: تنوع فرآیند; Asymmetric gate; Junctionless (JL); Double gate; Process variation
Statistical energy optimization on voltage-frequency island based MPSoCs in the presence of process variations
Keywords: تنوع فرآیند; System energy; Process variation; Voltage-frequency island; Multiprocessor system-on-chip;
Design and process variation analysis of CNTFET-based ternary memory cells
Keywords: تنوع فرآیند; CNTFET; Ternary SRAM design; Process variation
A comparative study on performance and reliability of 32-bit binary adders
Keywords: تنوع فرآیند; Binary adders; Aggressive supply voltage scaling; Superthreshold; Near-threshold; Performance; Reliability; Process variation; Negative bias temperature instability (NBTI)
Reducing random-dopant fluctuation impact using footer transistors in many-core systems
Keywords: تنوع فرآیند; Random dopant fluctuation; Process variation; Core speed variation; System level modeling; Voltage scaling; Multi-Vdd design; Multi-Vt design; Footer transistor; Simulation; Many-core; Multi-core; Process voltage and temperature variations
A novel memristor based physically unclonable function
Keywords: تنوع فرآیند; Hardware security primitive; Memristor; Modelling attack; Nanodevice; Physically unclonable function; Process variation
A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM
Keywords: تنوع فرآیند; FinFET; SRAM; Process variation; Evolutionary algorithm; Optimization; Stability
A near-threshold 7T SRAM cell with high write and read margins and low write time for sub-20Â nm FinFET technologies
Keywords: تنوع فرآیند; SRAM; FinFET; Low power; Near-threshold; Process variation;
Low-power pulsed hybrid flip-flop based on a C-element
Keywords: تنوع فرآیند; Flip-flop; Low-power; C-element; Data activity; Process variation
Scenario-based quasi-static task mapping and scheduling for temperature-efficient MPSoC design under process variation
Keywords: تنوع فرآیند; Multiple Processor System on Chip (MPSoC); Process variation; Thermal-aware quasi-static task mapping–scheduling; Hard real-time system; Performance-yield
Leak-Gauge: A late-mode variability-aware leakage power estimation framework
Keywords: تنوع فرآیند; Variability; Process variation; Leakage power;
Statistical full-chip total power estimation considering spatially correlated process variations
Keywords: تنوع فرآیند; Total power; Process variation; Spatial correlation; Variable reduction; Hermite orthogonal polynomial
Static statistical MPSoC power optimization by variation-aware task and communication scheduling
Keywords: تنوع فرآیند; MPSoC; Sensitivity analysis; Task scheduling; Process variation
Ground plane fin-shaped field effect transistor (GP-FinFET): A FinFET for low leakage power circuits
Keywords: تنوع فرآیند; FinFET; DIBL; Ground plane; Process variation; RDF; SRAM cell
Leakage reduction through optimization of regular layout parameters
Keywords: تنوع فرآیند; Regular layout optimization; Restrictive design rules; Non-rectangular gate; Critical dimension; Leakage; Process variation
Low-leakage soft error tolerant dual-port SRAM cells for cache memory applications
Keywords: تنوع فرآیند; Memory cell; Particle strike; Critical charge; Soft error rate; Leakage current; Read static-noise-margin; Read delay; Process variation
Assessment of carbon nanotube array transistors: A three-dimensional quantum simulation
Keywords: تنوع فرآیند; Device modeling; Nanotube array transistor; Quantum transport; Process variation
Statistical lifetime reliability optimization considering joint effect of process variation and aging
Keywords: تنوع فرآیند; Lifetime reliability; Process variation; NBTI; Duty cycle; Gate sizing
High-speed full adder based on minority function and bridge style for nanoscale
Keywords: تنوع فرآیند; Full adder; Minority function; Bridge style; High-speed; Nanoelectronics; Process variation
Variation in process conditions of porogen-based low-k films: A method to improve performance without changing existing process steps in a sub-100Â nm Cu damascene integration route
Keywords: تنوع فرآیند; Low-k; Porogen; Cure time; Process variation; Anneal; Capping layer;
Performance-asymmetry-aware scheduling for Chip Multiprocessors with static core coupling
Keywords: تنوع فرآیند; Process variation; Thread-level redundancy; Chip Multiprocessor; Scheduling
Process variation-aware performance analysis of asynchronous circuits
Keywords: تنوع فرآیند; Asynchronous circuits; Process variation; Spatial correlation; Timed Petri-Net
Impact of circuit assist methods on margin and performance in 6T SRAM
Keywords: تنوع فرآیند; SRAM; SNM; Write margin; Read assist; Write assist; Vmin; Scaling; Process variation; Yield
Timing analysis with compact variation-aware standard cell models
Keywords: تنوع فرآیند; Standard cell characterization; Process variation; Within-die variation; Timing analysis
Investigation of 65 nm CMOS transistor local variation using a FET array
Keywords: تنوع فرآیند; Process variation; Mismatch; SRAM
Analysis and optimization of leakage current characteristics in sub-65 nm dual Vt footed domino circuits
Keywords: تنوع فرآیند; Footed domino circuit; Dual threshold voltage; Leakage current; Process variation
Design for manufacturing meets advanced process control: A survey
Keywords: تنوع فرآیند; Integrated circuit design; Design for manufacturing; Process variation; Resolution enhancement techniques; Physical design; Process control; Variation tolerant design
A software technique to improve lifetime of caches containing ultra-leaky SRAM cells caused by within-die Vth variation
Keywords: تنوع فرآیند; Cache memories; Leakage currents; Yield; Process variation; Software; SRAM chips