
In situ determination of Sb distribution in Sb/GaAs(0 0 1) layer for high-density InAs quantum dot growth
Keywords: A1 ساختار سطح; 61.05.C−; 68.35.−p; 81.05.Ea; 81.15.HiA1. X-ray diffraction; A1. Surface structure; A3. Molecular-beam epitaxy; B2. Semiconducting III–V materials