
Optical properties of HfO2 thin films deposited by magnetron sputtering: From the visible to the far-infrared
Keywords: طیف سنجی مادون قرمز تبدیل فوریه یا طیف سنجی FTIR; Hafnium oxide; Infrared; Magnetron sputtering; Optical constants; Thin films; X-ray diffraction; Fourier transform infrared spectroscopy; Ellipsometry