Surface modification of Sylgard 184 polydimethylsiloxane by 254Â nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy
Keywords: میکروسکوپ یا ریزبین; 81.05.Lg; 81.65.âb; Polydimethylsiloxane; Surface modification; Excimer; Contact angle; Wettability; Microscopy;