Quantitative study of valence and configuration interaction parameters of the Kondo semiconductors CeM2Al10 (MÂ =Â Ru, Os and Fe) by means of bulk-sensitive hard X-ray photoelectron spectroscopy
Keywords: پلاسمون; Heavy fermion; Valence fluctuation; Hard X-ray photoelectron spectroscopy; Plasmon; Full multiplet; Single impurity model;